Browsing by author "Crupi, F."
Now showing items 1-18 of 18
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1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Magnone, P.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Pantisano, Luigi; Maji, D.; Rao, V.R.; Srinivasan, P. (2009) -
A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes
Crupi, F.; Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Groeseneken, Guido (2003) -
A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Crupi, F.; Giusi, G.; Iannacone, G.; Magnone, P.; Pace, C.; Simoen, Eddy; Claeys, Cor (2009) -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal (2009) -
DC and low-frequency noise behavior of the conductive filament in bipolar HfO2-based resistive random access memory
Maccaronio, A.; Crupi, F.; Procel, L.M.; Goux, Ludovic; Simoen, Eddy; Trojman, L.; Miranda, E. (2013) -
Does strain engineering impact the gate stack quality and reliability?
Claeys, Cor; Simoen, Eddy; Giusi, G.; Crupi, F. (2007) -
Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations
Campera, A.; Iannaccone, G.; Crupi, F.; Groeseneken, Guido (2005-04) -
Impact of high-mobility materials on the performance of near- and sub-threshold CMOS logic circuits
Crupi, F.; Albano, D.; Alioto, M.; Franco, Jacopo; Selmi, L.; Mitard, Jerome; Groeseneken, Guido (2013) -
Impact strain engineering on gate stack quality and reliability
Claeys, Cor; Simoen, Eddy; Put, Sofie; Giusi, G.; Crupi, F. (2008) -
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks
Srinivasan, Purushothaman; Crupi, F.; Simoen, Eddy; Magnone, P.; Pace, C.; Misra, D.; Claeys, Cor (2007) -
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack
Maji, D.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Rao, V.R. (2008) -
On the defect generation and low voltage extrapolation of QBD in SiO2/HfO2 stacks
Degraeve, Robin; Crupi, F.; Kwak, Dong Hwa; Groeseneken, Guido (2004) -
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer
Giusi, G.; Crupi, F.; Simoen, Eddy; Eneman, Geert; Jurczak, Gosia (2007) -
pMOSFET off-state leakage and junction leakage current in Ge-based devices
Simoen, Eddy; De Stefano, Francesca; Eneman, Geert; De Jaeger, Brice; Claeys, Cor; Crupi, F. (2009) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Mercha, Abdelkarim; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009)