Browsing imec Publications by author "Zahid, Mohammed"
Now showing items 41-56 of 56
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Integration of a multi-layer inter-gate dielectric with hybrid floating gate towards 10nm planar NAND flash
Breuil, Laurent; Blomme, Pieter; Tan, Chi Lim; Lisoni, Judit; Souriau, Laurent; Zahid, Mohammed; Richard, Olivier; Bender, Hugo; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Lifetime investigation of Si3N4/Al2O3 as gate dielectric for AlGaN/GaN MIS-HEMTs studied with Time Dependent Dielectric Breakdown
Zahid, Mohammed; Marcon, Denis; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan (2012) -
New developments in charge pumping measurements on thin stacked dielectrics
Toledano-Luque, Maria; De Gendt, Stefan; Groeseneken, Guido; Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; San Andres, Enrique (2008) -
New-source-side breakdown mechanism in AlGaN/GaN insulated-Gate HEMTs
Bahl, Sandeep; Van Hove, Marleen; Kang, Xuanwu; Marcon, Denis; Zahid, Mohammed; Decoutere, Stefaan (2013) -
Nitride engineering for improved erase performance and retention of TANOS NAND Flash memory
Van den Bosch, Geert; Furnemont, Arnaud; Zahid, Mohammed; Degraeve, Robin; Breuil, Laurent; Cacciato, Antonio; Rothschild, Aude; Olsen, Chris; Ganguly, Udayan; Van Houdt, Jan (2008-05) -
Optimization of the crystallization phase of rare-earth aluminates for blocking dielectric application in TANOS type Flash memories
Breuil, Laurent; Adelmann, Christoph; Van den Bosch, Geert; Cacciato, Antonio; Zahid, Mohammed; Toledano Luque, Maria; Suhane, Amit; Arreghini, Antonio; Degraeve, Robin; Van Elshocht, Sven; Debusschere, Ingrid; Kittl, Jorge; Jurczak, Gosia; Van Houdt, Jan (2010) -
Profiling different kind of generated defects at elevated temperatures in both SiO2 and high-k dielectrics
Sahhaf, Sahar; Degraeve, Robin; Zahid, Mohammed; Groeseneken, Guido (2010) -
Properties and dynamic behavior of electron traps in HfO2/SiO2 stacks
Zhao, C.Z.; Zahid, Mohammed; Zhang, John; Groeseneken, Guido; Degraeve, Robin; De Gendt, Stefan (2005-06) -
Resolving fast VtH transients after program/erase of flash memory stacks and their relation to electron and hole defects
Toledano Luque, Maria; Degraeve, Robin; Zahid, Mohammed; Kaczer, Ben; Kittl, Jorge; Jurczak, Gosia; Groeseneken, Guido; Van Houdt, Jan (2009) -
Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric
Zahid, Mohammed; Breuil, Laurent; Degraeve, Robin; Blomme, Pieter; Tan, Chi Lim; Lisoni, Judit; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Trap spectroscopy by charge injection and sensing (TSCIS): a quantitative electrical technique for studying defects in dielectric stacks
Degraeve, Robin; Cho, Moon Ju; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Van Houdt, Jan; Jurczak, Gosia; Groeseneken, Guido (2008) -
Trapping in 1nm EOT high-k / MG
Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; Aoulaiche, Marc; Trojman, Lionel; Ferain, Isabelle; san andres, e; Shickova, Adelina; O'Connor, Robert; Groeseneken, Guido; Heyns, Marc; De Gendt, Stefan (2008) -
Trapping in 1nm EOT high-k dielectrics
Pantisano, Luigi; Zahid, Mohammed; Degraeve, Robin; Groeseneken, Guido (2008) -
Understanding the impact of metal gate on TANOS performance and retention
Van den Bosch, Geert; Arreghini, Antonio; Breuil, Laurent; Cacciato, Antonio; Schram, Tom; Suhane, Amit; Zahid, Mohammed; Jurczak, Gosia; Van Houdt, Jan (2010) -
Understanding the potential and limitations of the HfAlO as interpoly dielectric in floating gate flash memory
Govoreanu, Bogdan; Degraeve, Robin; Zahid, Mohammed; Nyns, Laura; Cho, Moon Ju; Kaczer, Ben; Jurczak, Gosia; Kittl, Jorge; Groeseneken, Guido (2009) -
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
Suhane, Amit; Arreghini, Antonio; Degraeve, Robin; Van den Bosch, Geert; Breuil, Laurent; Zahid, Mohammed; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan (2010)