Browsing Conference contributions by imec author "df5489fddcf1483b5d3723d69fd7de11fc8ff7f0"
Now showing items 21-40 of 361
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A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Bury, Erik; Vandemaele, Michiel; Kaczer, Ben; Degraeve, Robin (2022) -
A single device based Voltage Step Stress (VSS) technique for fast reliability screening
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Zhang, X.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido; Ren, P.; Wang, R.; Huang, R. (2014) -
A step towards a better understanding of silicon passivated (100) Ge p-channel
Pourtois, Geoffrey; Houssa, Michel; De Jaeger, Brice; Leys, Frederik; Kaczer, Ben; Martens, Koen; Caymax, Matty; Meuris, Marc; Groeseneken, Guido; Heyns, Marc (2007) -
A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
Ji, Z.; Zhang, J.F.; Lin, L.; Duan, M.; Zhang, W.; Zhang, X.; Gao, R.; Kaczer, Ben; Franco, Jacopo; Schram, Tom; Horiguchi, Naoto; De Gendt, Stefan; Groeseneken, Guido (2015) -
A two-stage model for negative bias temperature instability
Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang; Aichinger, Thomas; Hehenberger, Philipp; Nelhiebel, M. (2009-04) -
Accelerated Capture and Emission (ACE) measurement pattern for efficient BTI characterization and modeling
Wu, Zhicheng; Franco, Jacopo; Claes, Dieter; Rzepa, Gerhard; Roussel, Philippe; Collaert, Nadine; Groeseneken, Guido; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2019) -
Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultra thin oxides
Roussel, Philippe; Degraeve, Robin; Van den bosch, G.; Kaczer, Ben; Groeseneken, Guido (2001) -
Addressing key concerns for implementation of Ni FUSI into manufacturing for 45/32 nm CMOS
Shickova, Adelina; Kauerauf, Thomas; Rothschild, Aude; Aoulaiche, Marc; Sahhaf, Sahar; Kaczer, Ben; Veloso, Anabela; Torregiani, Cristina; Pantisano, Luigi; Lauwers, Anne; Zahid, Mohammed; Rost, Tim; Tigelaar, H.; Pas, M.; Fretwell, J.; McCormack, J.; Hoffmann, Thomas; Kerner, Christoph; Chiarella, Thomas; Brus, Stephan; Harada, Yoshinao; Niwa, Masaaki; Kaushik, Vidya; Maes, Herman; Absil, Philippe; Groeseneken, Guido; Biesemans, Serge; Kittl, Jorge (2007) -
Advanced capacitor dielectrics: towards 2x nm DRAM
Kim, Min-Soo; Popovici, Mihaela Ioana; Swerts, Johan; Pawlak, Malgorzata; Tomida, Kazuyuki; Kaczer, Ben; Opsomer, Karl; Schaekers, Marc; Tielens, Hilde; Vrancken, Christa; Van Elshocht, Sven; Debusschere, Ingrid; Altimime, Laith; Kittl, Jorge (2011-05) -
Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
Grasser, Tibor; Rott, K.; Reisinger, H.; Wagner, P.J.; Goes, W; Schanovsky, F.; Waltl, M.; Toledano Luque, Maria; Kaczer, Ben (2013) -
Advanced dielectrics targeting 2X DRAM MIM capacitors
Popovici, Mihaela Ioana; Swerts, Johan; Aoulaiche, Marc; Redolfi, Augusto; Kaczer, Ben; Kim, Min-Soo; Douhard, Bastien; Delabie, Annelies; Clima, Sergiu; Jurczak, Gosia; Van Elshocht, Sven (2013) -
Advanced modeling of oxide defects for random telegraph noise
Goes, Wolfgang; Schanovsky, Franz; Grasser, Tibor; Reisinger, Hans; Kaczer, Ben (2011-06) -
Al-induced defect generation in cubic phase HfO2/SiO2/Si gate stacks
Arimura, Hiroaki; Ragnarsson, Lars-Ake; Veloso, Anabela; Adelmann, Christoph; Degraeve, Robin; Schram, Tom; Chew, Soon Aik; Franco, Jacopo; Cho, Moon Ju; Kaczer, Ben; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron (2012) -
An energy-level perspective of bias temperature instability
Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang (2008-04) -
An equivalent circuit model for the recovery component of BTI
Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserat; Aymerich, X.; Kaczer, Ben; Groeseneken, Guido (2008-09) -
Analysing antenna ratio dependence of plasma charging damage with Weibull breakdown statistics
Van den Bosch, Geert; Creusen, Martin; Degraeve, Robin; Kaczer, Ben; Groeseneken, Guido (2000) -
Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements
Schreurs, Dominique; Pantisano, Luigi; Kaczer, Ben (2004) -
Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stack
Degraeve, Robin; Kaczer, Ben; Houssa, Michel; Groeseneken, Guido; Heyns, Marc; Jeon, J. S.; Halliyal, A. (1999) -
Analysis of NBTI effects on high frequency digital circuits
Unutulmaz, Ahmet; Helms, Domenik; Eilers, Reef; Metzdorf, Malte; Kaczer, Ben; Nebel, Wolfgang (2016) -
Analysis of short channel MOSFET behavior after gate oxide breakdown and its impact on digital circuit reliability
Groeseneken, Guido; Kaczer, Ben; Degraeve, Robin (2003-04)