Recently added

Stuffing-enabled confinement of self-assembled monolayer used as sealing agent on plasma-exposed 2.0 p-OSG films

Sun, Yiting; Levrau, Elisabeth; Zhang, Liping; Geypen, Jef; Franquet, Alexis; Le, Quoc Toan; de Marneffe, Jean-Francois; Bender, Hugo; Struyf, Herbert; Baklanov, Mikhaïl; Detavernier, Christophe; De Feyter, Steven; Armini, Silvia (2014)

Analysis of 3D interconnect performances Versus Si interposer substrate resistivity

Sun, Xiao; Van der Plas, Geert; Detalle, Mikael; Beyne, Eric (2014)

Selective growth of strained Ge on relaxed SiGe in shallow trench isolation for p-MOS FINFET

Sun, Jianwu; Loo, Roger; Witters, Liesbeth; Hikavyy, Andriy; Shimura, Yosuke; Favia, Paola; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Collaert, Nadine; Thean, Aaron (2014)

Use of X-ray techniques in the development of Ge MOSFET devices

Sun, Jianwu; Hikavyy, Andriy; Shimura, Yosuke; Witters, Liesbeth; Tielens, Hilde; Ryan, Paul; Loo, Roger (2014)

Scaling the 3D bumps pitch from 20 to 10 μm, focusing on the wet Cu seed etch process development

Suhard, Samuel; Moussa, Alain; Slabbekoorn, John; Beirnaert, Filip; De Preter, Inge; Holsteyns, Frank (2014)

Pattern fidelity verification for logic design in EUV lithography

Sugawara, Mino; Hendrickx, Eric; Philipsen, Vicky; Maloney, Chris; Fenger, Germain (2014)

TCAD methodology for simulation of GaN-HEMT power devices

Strauss, Stephan; Axel, Erlebach; Tommaso, Cilento; Bakeroot, Benoit; Marcon, Denis; Stoffels, Steve (2014-06)

Sensing in the GHZ range@ ETRO-VUB: beyond the conventional limits

Stiens, Johan; Vandermeiren, Werner; Matvejev, Vladimir; De Tandt, Cathleen; Ranson, Willy; Vounckx, Roger; Zhu, Bin; Pourkazemi, Ali; Alkore, Hameda; Zhang, Yuchen; Pandey, Gokarna; Arta, A (2014)

Generic label-free and immobilization-free biosensing in nL liquids with terahertz waves

Stiens, Johan; Matvejev, Vladimir; Zhang, Yuchen; Willaert, Ronnie; Maes, Dominique; Georgopoulou, Stella; Muyldermans, Serge; Lagae, Liesbet (2014)

TFT circuits in sensor arrays and RFID tags

Steudel, Soeren (2014)

Paramagnetic oxide defects in Sc2O3-passivated (100)Ge/HfO2 stacks

Stesmans, Andre; Iacovo, Serena; Cott, Daire; Thean, Aaron; Arimura, Hiroaki; Sioncke, Sonja; Afanas'ev, Valeri (2014)

Power management for vibrational energy harvesters

Stanzione, Stefano; van Liempd, Chris; Van Hoof, Chris (2014)

Lens-free digital in-line holographic imaging for wide field-of-view, high resolution and real-time monitoring of complex microscopic objects

Stahl, Richard; Vanmeerbeeck, Geert; Lafruit, Gauthier; Huys, Roeland; Reumers, Veerle; Lambrechts, Andy; Liao, CK; Hsiao, Chin-Chun; Yashiro, Masayuki; Takemoto, Masashi; Nagata, Tomohisa; Gomi, Shinichi; Hatabayashi, Kunitada; Oshima, Yasuhiro; Ozaki, Shigenori; Nishishita, Naoki; Kawamata, Shin (2014)

Conference contributions: Recent submissions

Stuffing-enabled confinement of self-assembled monolayer used as sealing agent on plasma-exposed 2.0 p-OSG films

Analysis of 3D interconnect performances Versus Si interposer substrate resistivity

Selective growth of strained Ge on relaxed SiGe in shallow trench isolation for p-MOS FINFET

Use of X-ray techniques in the development of Ge MOSFET devices

Scaling the 3D bumps pitch from 20 to 10 μm, focusing on the wet Cu seed etch process development

Pattern fidelity verification for logic design in EUV lithography

TCAD methodology for simulation of GaN-HEMT power devices

Sensing in the GHZ range@ ETRO-VUB: beyond the conventional limits

Generic label-free and immobilization-free biosensing in nL liquids with terahertz waves

TFT circuits in sensor arrays and RFID tags

Paramagnetic oxide defects in Sc2O3-passivated (100)Ge/HfO2 stacks

Power management for vibrational energy harvesters

Lens-free digital in-line holographic imaging for wide field-of-view, high resolution and real-time monitoring of complex microscopic objects

Integrated grating coupler/power splitter for on-chip optical power distribution

Optimized process simulation of USJ for HKMG DRAM periphery transistors

Impact of off state stress on advanced high-K metal gate NMOSFETs

A 6.2mW 7b 3.5GS/s time interleaved 2-stage pipelined ADC in 40nm CMOS

Lattice-matched heterostructure envelope functions and band-to-band transmission through broken-gap heterostructures

Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications

Investigation of interactions between metrology and lithography with a CD SEM simulator

Conference contributions: Recent submissions

Stuffing-enabled confinement of self-assembled monolayer used as sealing agent on plasma-exposed 2.0 p-OSG films ﻿

Analysis of 3D interconnect performances Versus Si interposer substrate resistivity ﻿

Selective growth of strained Ge on relaxed SiGe in shallow trench isolation for p-MOS FINFET ﻿

Use of X-ray techniques in the development of Ge MOSFET devices ﻿

Scaling the 3D bumps pitch from 20 to 10 μm, focusing on the wet Cu seed etch process development ﻿

Pattern fidelity verification for logic design in EUV lithography ﻿

TCAD methodology for simulation of GaN-HEMT power devices ﻿

Sensing in the GHZ range@ ETRO-VUB: beyond the conventional limits ﻿

Generic label-free and immobilization-free biosensing in nL liquids with terahertz waves ﻿

TFT circuits in sensor arrays and RFID tags ﻿

Paramagnetic oxide defects in Sc2O3-passivated (100)Ge/HfO2 stacks ﻿

Power management for vibrational energy harvesters ﻿

Lens-free digital in-line holographic imaging for wide field-of-view, high resolution and real-time monitoring of complex microscopic objects ﻿

Integrated grating coupler/power splitter for on-chip optical power distribution ﻿

Optimized process simulation of USJ for HKMG DRAM periphery transistors ﻿

Impact of off state stress on advanced high-K metal gate NMOSFETs ﻿

A 6.2mW 7b 3.5GS/s time interleaved 2-stage pipelined ADC in 40nm CMOS ﻿

Lattice-matched heterostructure envelope functions and band-to-band transmission through broken-gap heterostructures ﻿

Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications ﻿

Investigation of interactions between metrology and lithography with a CD SEM simulator ﻿

Stuffing-enabled confinement of self-assembled monolayer used as sealing agent on plasma-exposed 2.0 p-OSG films

Analysis of 3D interconnect performances Versus Si interposer substrate resistivity

Selective growth of strained Ge on relaxed SiGe in shallow trench isolation for p-MOS FINFET

Use of X-ray techniques in the development of Ge MOSFET devices

Scaling the 3D bumps pitch from 20 to 10 μm, focusing on the wet Cu seed etch process development

Pattern fidelity verification for logic design in EUV lithography

TCAD methodology for simulation of GaN-HEMT power devices

Sensing in the GHZ range@ ETRO-VUB: beyond the conventional limits

Generic label-free and immobilization-free biosensing in nL liquids with terahertz waves

TFT circuits in sensor arrays and RFID tags

Paramagnetic oxide defects in Sc2O3-passivated (100)Ge/HfO2 stacks

Power management for vibrational energy harvesters

Lens-free digital in-line holographic imaging for wide field-of-view, high resolution and real-time monitoring of complex microscopic objects

Integrated grating coupler/power splitter for on-chip optical power distribution

Optimized process simulation of USJ for HKMG DRAM periphery transistors

Impact of off state stress on advanced high-K metal gate NMOSFETs

A 6.2mW 7b 3.5GS/s time interleaved 2-stage pipelined ADC in 40nm CMOS

Lattice-matched heterostructure envelope functions and band-to-band transmission through broken-gap heterostructures

Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications

Investigation of interactions between metrology and lithography with a CD SEM simulator