Browsing Presentations by imec author "3ce6c010d34b598716a9ed1f3c90491ed8a56850"
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Alternative gate insulator materials for future generation MOSFETs
Heyns, Marc; Bender, Hugo; Carter, Richard; Caymax, Matty; Conard, Thierry; De Gendt, Stefan; Degraeve, Robin; De Witte, Hilde; Groeseneken, Guido; Haukka, S.; Henson, Kirklen; Houssa, Michel; Kubicek, Stefan; Maes, Jos; Naili, Mohamed; Nohira, Hiroshi; Tsai, Wilman; Tuominen, Marko; Vandervorst, R.; Wilhelm, Rudi; Young, Edward; Zhao, Chao (2001) -
Atomic layer deposition as an enabling technology for fabrication of germanium MOS transistor
Eneman, Geert; Delabie, Annelies; Van Elshocht, Sven; De Jaeger, Brice; Nicholas, Gareth; Martens, Koen; Brunco, David; Zimmerman, Paul; Houssa, Michel; Pourtois, Geoffrey; Kaczer, Ben; Leys, Frederik; Winderickx, Gillis; Huyghebaert, Cedric; Terzieva, Valentina; Loo, Roger; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007) -
Band alignment at the interfaces of Al2O3 and ZrO2-based insulators with metals and Si
Afanas'ev, V. V.; Houssa, Michel; Stesmans, Andre; Heyns, Marc (2001) -
Characterization of (ultra)thin dielectrica
Vandervorst, Wilfried; De Witte, Hilde; Conard, Thierry; Janssens, Tom; Schaekers, Marc; Brijs, Bert; Houssa, Michel (2000) -
Crystallization behaviour of ZrO2/Al2O3-based high-k gate stacks
Zhao, Chao; Richard, Olivier; Bender, Hugo; Houssa, Michel; Carter, Richard; De Gendt, Stefan; Heyns, Marc; Young, Edward; Tsai, Wilman; Roebben, G.; Van der Biest, O.; Haukka, S. (2001) -
Defect generation in high-k gate dielectric stacks under electrical stress: the impact of hydrogen
Houssa, Michel; Heyns, Marc; Stesmans, Andre (2004) -
Effect of Si surface roughness on the current-voltage characteristics of ultra-thin gate oxides
Houssa, Michel; Nigam, Tanya; Mertens, Paul; Heyns, Marc (1998) -
Electrical and physical characterization of MOSFETs with MBE grown La2HfO7 and HfO2 high-k dielectrics integrated in a conventional flow
Conard, Thierry; Pantisano, Luigi; Claes, Martine; Demand, Marc; Deweerd, Wim; De Gendt, Stefan; Houssa, Michel; Lujan, Guilherme; Ragnarsson, Lars-Ake; Rohr, Erika; Schram, Tom; Hooker, Jacob; Rittersma, Chris; Fompeyrinne, J.; Loquet, J.P. (2005) -
Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacks
Houssa, Michel; De Jaeger, Brice; Delabie, Annelies; Van Elshocht, Sven; Afanasiev, Valeri; Autran, J.L.; Stesmans, Andre; Meuris, Marc; Heyns, Marc (2004) -
Electrical characteristics of high-k based MOS devices
Houssa, Michel (2004) -
Electrical properties and reliability of ultrathin remote plasma enhanced CVD Si3N4 layers
Houssa, Michel; Degraeve, Robin; Pomarede, C.; van Dijk, Kitty; Werkhoven, Chris; Mertens, Paul; Heyns, Marc; Stesmans, Andre (1999) -
Electrical properties of metal-insulator-semiconductor devices with high permittivity gate dielectric layers
Houssa, Michel; Degraeve, Robin; Heyns, Marc; Kaczer, Ben; Groeseneken, Guido; Naili, Mohamed; Mertens, Paul; Stesmans, Andre; Jeon, J. S.; Halliyal, A. (2000) -
Electron energy band alignment at interfaces of (100)Ge with Gd2O3 and LaHfO
Afanasiev, Valeri; Shamuilia, Sheron; dimoulas, A.; Stesmans, Andre; Houssa, Michel (2005) -
Electron spin resonance analysis of interfacial Si dangling bond type defects in stack of ultrathin SiO2, Al2O3, and ZrO2 layers on (100)Si
Stesmans, Andre; Afanas'ev, V. V.; Houssa, Michel (2001) -
Electron spin resonance observation of Si dangling bond type defects at the interface (100)Si and ultrathin stacks of SiO2, Al2O3, and ZrO2
Stesmans, Andre; Afanas'ev, V. V.; Houssa, Michel (2001) -
Excellent Roff/Ron ratio and short programming time in Cu/Al2O3-based conductive-bridge RAM under low-current (10μA) operation
Belmonte, Attilio; Fantini, Andrea; Degraeve, Robin; Redolfi, Augusto; Houssa, Michel; Jurczak, Gosia; Goux, Ludovic (2015) -
First-principles simulations of the oxidation of the GaAs(001)-beta2(2x4) surface
Scarrozza, Marco; Pourtois, Geoffrey; Houssa, Michel; Meuris, Marc; Heyns, Marc (2008) -
Fundamental aspects of germanium surface passivation by gas phase oxidation and liquid phase sulfidation
Fleischmann, Claudia; Schouteden, Koen; Houssa, Michel; Sioncke, Sonja; Mueller, Matthias; Van Haesendonck, Chris; Temst, Kristiaan; Vantomme, Andre (2014) -
Ge and III-V passivation issues
Houssa, Michel; Brammertz, Guy; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007) -
Ge and III/V: the CMOS of the future
Heyns, Marc; Adelmann, Christoph; Bellenger, Florence; Brammertz, Guy; Brunco, David; Caymax, Matty; De Jaeger, Brice; Delabie, Annelies; Eneman, Geert; Houssa, Michel; Kaczer, Ben; Lin, Dennis; Martens, Koen; Meuris, Marc; Mitard, Jerome; Opsomer, Karl; Pourtois, Geoffrey; Satta, Alessandra; Scarrozza, Marco; Simoen, Eddy; Sioncke, Sonja; Souriau, Laurent; Terzieva, Valentina; Van Elshocht, Sven (2007)