Browsing Presentations by imec author "4e15a60700e62b35c95d4ee0a9a43d2601311002"
Now showing items 1-20 of 25
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A new physically-based model for temperature acceleration of time-to-breakdown
Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
Charge trapping and dielectric reliability in alternative gate dielectrics: a key challenge for integration
Kerber, Andreas; Cartier, Eduard; Degraeve, Robin; Roussel, Philippe; Pantisano, Luigi; Kauerauf, Thomas; Groeseneken, Guido; De Gendt, Stefan; Heyns, Marc (2002) -
Cost-effectiveness of wafer-to-wafer 3D chip stacking with matching pre-tested wafers
Verbree, Jouke; Marinissen, Erik Jan; Roussel, Philippe; Velenis, Dimitrios (2010) -
Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, C.; Herzog, H. J.; Blondeel, A.; Clauws, P. (2000) -
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility Transistors
Eneman, Geert; Simoen, Eddy; Delhougne, Romain; Gaubas, Eugenijus; Simons, Veerle; Roussel, Philippe; Verheyen, Peter; Lauwers, Anne; Loo, Roger; Vandervorst, Wilfried; De Meyer, Kristin; Claeys, Cor (2004) -
Device to product level assessment of process variability
Miranda Corbalan, Miguel; Dobrovolny, Petr; Zuber, Paul; Roussel, Philippe (2011) -
Effect of deposition and annealing temperature on the structural and mechanical properties of poly SiGe
Sedky, Sherif; Witvrouw, Ann; Caymax, Matty; Roussel, Philippe (2000) -
Effect of oxide and W-CMP on the material properties and electromigration behaviour of layered aluminium metallizations
Heyvaert, Ilse; Van Hove, Marleen; Witvrouw, Ann; Maex, Karen; Saerens, Annelies; Roussel, Philippe; Bender, Hugo (1999) -
Electron energy dependence of defect generation in high-k gate stacks
O'Connor, Robert; Pantisano, Luigi; Degraeve, Robin; Kauerauf, Thomas; Kaczer, Ben; Roussel, Philippe; Groeseneken, Guido (2007) -
FIB preparation of cross-sectional transmission electron microscopy specimens of unpassivated device structures
Bender, Hugo; Van Marcke, Pieter; Drijbooms, Chris; Roussel, Philippe (1997) -
Impact of enhanced localized degradation on time-to-breakdown in high-k oxides
Kauerauf, Thomas; Roussel, Philippe; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (2004) -
Impact of nitridation on recoverable and permanent NBTI degradation in high-k/metal-gate pMOSFETs
Aoulaiche, Marc; Kaczer, Ben; Roussel, Philippe; Houssa, Michel; De Gendt, Stefan; Maes, Herman; Groeseneken, Guido (2008) -
Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001) -
Impact of the hard breakdown detection method on the extraction of the Wearout distribution parameters
Sahhaf, Sahar; Degraeve, Robin; Roussel, Philippe; Kaczer, Ben; Kauerauf, Thomas; Groeseneken, Guido (2007) -
Investigation of bias-temperature instability in work-function-tuned high-k/metal-gate stacks
Kaczer, Ben; Veloso, Anabela; Roussel, Philippe; Grasser, Tibor; Groeseneken, Guido (2008) -
New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides
Groeseneken, Guido; Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Depas, Michel; Maes, Herman (1996) -
Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, Vinicius V. A.; Mahato, Swaraj; Simoen, Eddy; Wirth, Gilson I.; Groeseneken, Guido (2011) -
Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, V. V. A.; Mahato, S.; Simoen, Eddy; Catthoor, Francky; Wirth, G. I.; Groeseneken, Guido (2012) -
Relaxing the STT-MRAM reliability challenge by scaling MgO thickness
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
Reliability aware design: from single defect physics to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter; Grasser, Tibor; Roussel, Philippe; Groeseneken, Guido (2012)