Browsing by Author "Amat, Esteve"

A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics

Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks

Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures

Gate voltage influence on the channel hot-carrier degradation of high-k-based devices

New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices

Processing dependences of CHC degradation on strained-Si pMOSFETs

Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric

SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors