Browsing by Author "Chen, Rongmei"
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Publication 3D-optimized SRAM Macro Design and Application to Memory-on-Logic 3D-IC at Advanced Nodes
Proceedings paper2020, IEEE International Electron Devices Meeting (IEDM), DEC 12-18, 2020Publication A Modeling Study of Stacked Cu-CNT TSV on Electrical, Thermal, and Reliability Analysis
Journal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 1, p.184-191Publication A Modeling Study on Electrical and Thermal Behavior of CNT TSV for Multilayer Structure
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 9, p.4779-4785Publication Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation--Part I: CNFET Transistor Optimization
Journal article2022, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, (30) 4, p.432-439Publication Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation--Part II: CNT Interconnect Optimization
Journal article2022, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, (30) 4, p.440-448Publication Design and Optimization of SRAM Macro and Logic Using Backside Interconnects at 2nm node
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021Publication Design And Sign-off Methodologies For Wafer-To-Wafer Bonded 3D-ICs At Advanced Nodes (invited)
Proceedings paper2021-11-04, 23rd ACM/IEEE International Workshop on System-Level Interconnect Pathfinding (SLIP), NOV 04, 2021, p.17-23Publication Design Enablement of 3-Dies Stacked 3D-ICs Using Fine-Pitch Hybrid-Bonding and TSVs
Proceedings paper2023, IEEE International 3D Systems Integration Conference (3DIC), MAY 10-12, 2023Publication Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node
Journal article2022, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 6, p.3113-3117Publication Heavy-ion and pulsed laser induced single-event double transients in nanometer inverter chain
;Zhao, Wen ;Chen, Wei ;He, Chaohui; ;Zhang, Fengqi ;Guo, Xiaoqiang ;Lu, ChaoShen, ChenJournal article2023, RADIATION EFFECTS AND DEFECTS IN SOLIDS, (178) 3-4, p.393-405Publication Increasing Functionality of Wafer's Backside: Analysis of Si and WS2 Backside Power-Switch
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 7, p.3970-3974Publication Innovations in Transistor Architecture and Device Connectivity for Advanced Logic Scaling
; ; ; ; ; Proceedings paper2022, International Conference on IC Design and Technology (ICICDT), SEP 21-23, 2022, p.51-54Publication Insights into Scaled Logic Devices Connected from Both Wafer Sides
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication IR-Drop Analysis of Hybrid Bonded 3D-ICs with Backside Power Delivery and mu- & n- TSVs
;Genneret, B. ;Chou, R.; ; ; ; Proceedings paper2021, IEEE International Interconnect Technology Conference (IITC), JUL 06-09, 2021Publication Power, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network
; ; ; ; ; Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication Recent Progress and Challenges Regarding Carbon Nanotube On-Chip Interconnects
Journal article review2022, MICROMACHINES, (13) 7, p.1148Publication Scaled FinFETs Connected by Using Both Wafer Sides for Routing via Buried Power Rails
Journal article2022, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 12, p.7173-7179