Browsing by Author "Crupi, F."

1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes

A model for MOS gate stack quality evaluation based on the gate current 1/f noise

Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures

Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

DC and low-frequency noise behavior of the conductive filament in bipolar HfO2-based resistive random access memory

Does strain engineering impact the gate stack quality and reliability?

Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations

Impact of high-mobility materials on the performance of near- and sub-threshold CMOS logic circuits

Impact strain engineering on gate stack quality and reliability

Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks

Modeling the gate current 1/f noise and its application to advanced CMOS devices

On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack

On the defect generation and low voltage extrapolation of QBD in SiO2/HfO2 stacks

Performance and reliability of strained-silicon nMOSFETs with SiN cap layer

pMOSFET off-state leakage and junction leakage current in Ge-based devices

The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks

The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks