Browsing by Author "Jech, Markus"

A Compact Physics Analytical Model for Hot-Carrier Degradation

Ab initio treatment of silicon-hydrogen bond rupture at Si/SiO2 interfaces

Analysis of the features of hot-carrier degradation in FinFETs

Border trap based modeling of SiC transistor transfer characteristics

Enhancing the quality of low temperature SiO2 by atomic hydrogen exposure for excellent NBTI reliability

First–principles parameter–free modeling of n– and p–FET hot–carrier degradation

Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory

Impact of the device geometric parameters on hot-carrier degradation in FinFETs

Mixed hot-carrier/bias temperature instability degradation regimes in full {VG, VD} bias space: implications and peculiarities

Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors

Physical principles of self-consistent simulation of the generation of interface states and the transport of hot charge carriers in field-effect transistors based on metal–oxide–semiconductor structures

Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor Devices

Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants

Structure, electronic properties, and energetics of oxygen vacancies in varying concentrations of SixGe1-xO2

TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs