Browsing by Author "Luo, Jun"

A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs

Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization

Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs

Defect engineering for shallow n-type junctions in germanium: facts and fiction

Distinction between silicon and oxide traps using single-trap spectroscopy

Impact of the effective work function gate metal on the low-frequency noise of gate-all-around Silicon-on-Insulator NWFETs

Implications of inelastic tunneling on the depth of oxide traps in MOSFETs assessed by RTS or BTI

In-band label extractor based on cascaded Si ring resonators enabling 160Gb/s optical packet switching modules

Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursors

Low frequency noise characterization of GeOx passivated Germanium MOSFETs

Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices

Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack

Random telegraph noise: the key to single defect studies in nano-devices

Study of DID/ID of a single charge trap in UTBOX silicon films

Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETs

The assessment of border traps in high-mobility channel materials

Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs

Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs