Browsing by Author "Smolanka, A."

Back-gate induced noise overshoot in partially-depleted SOI MOSFETs

Behavior of the 1/f noise and electron mobility in 65 nm FD SOI nMOSFETs employing different tensile-strain-inducing techniques

Black-gate induced noise overshoot in partially-depleted SOI MOSFETs

Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs

Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias

Influence of an accumulation back-gate voltage on the low-frequency noise spectra of 0.13 μm fully-depleted SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

Influence of the accumulation back-gate voltage on the noise spectra of deep submicron SOI MOSFET's in a wide range of drain voltages

Investigation of tri-gate FinFETs by noise methods

Linear kink effect Lorentzians in the noise spectra of n- and p-channel fin field-effect transistors processed in standard and strained silicon-on-insulator substrates

Linear-kink-noise suppression in partially depleted SOI using the twin-gate MOSFET configuration

LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric

Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors

Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers

Low-frequency noise of strained and non-strained n-channel tri-gate FinFETs with different gate dielectrics

On the 1/f noise of triple-gate field-effect transistors with high-k gate dielectric

Origin of the front-back gate coupling in partially depleted and fully depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors with accumulated back gate

Short-channel effects in the Lorentzian noise induced by the EVB tunneling in partially depleted SOI MOSFETs