Browsing by Author "Yakimets, Dmitry"
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Publication 5nm: has the time for a device change come?
Proceedings paper2016, 17th International Symposium on Quality Electronic Design - ISQED, 15/03/2016, p.275-277Publication A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs
Journal article2016, IEEE Transactions on Electron Devices, (63) 2, p.643-651Publication Benchmarking of MoS2 FETs with multigate Si-FET options for 5 nm and beyond
Journal article2015, IEEE Transactions on Electron Devices, (62) 12, p.4051-4156Publication Built-in sheet charge as an alternative to dopant pockets in tunnel field-effect transistors
; ; ; ; ;El Kazzi, SalimJournal article2018, IEEE Journal of the Electron Devices Society, 6, p.658-663Publication Buried power rail integration with FinFETs for ultimate CMOS scaling
Journal article2020, IEEE Transactions on Electron Devices, (67) 12, p.5349-5354Publication Buried Power Rail Integration with Si FinFETs for CMOS Scaling beyond the 5 nm Node
Proceedings paper2020, IEEE Symposium on VLSI Technology and Circuits, JUN 15-19, 2020Publication Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies
;Huynh Bao, Trong; ; ; ; Proceedings paper2014-09, 44th European Solid-State Device Research Conference - ESSDERC, 22/09/2014, p.102-105Publication Design technology co-optimization for enabling 5nm gate-all-around nanowire 6T SRAM
Proceedings paper2015, International Conference on IC Design and Technology - ICICDT, 1/06/2015, p.1-4Publication Device challenges for logic scaling for sub-5 nm node
Meeting abstract2018, ISTDM/ICSI 2018, 27/05/2018Publication Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7
Proceedings paper2017, 47th European Solid-State Device Research Conference - ESSDERC, 11/09/2017, p.256-259Publication Device exploration of nanosheet transistors for sub-7nm technology node
Journal article2017, IEEE Transactions on Electron Devices, (64) 6, p.2707-2713Publication Device-, circuit- & block-level evaluation of CFET in a 4 track library
Proceedings paper2019, 2019 Symposia on VLSI Technology and Circuits, 9/06/2019, p.T204-T205Publication Device/system performance modeling of stacked lateral NWFET logic
Proceedings paper2016, 17th International Symposium on Quality Electronic Design - ISQED, 15/04/2016, p.215-220Publication Dimensioning for power and performance under 10nm: The limits of FinFETs scaling
Proceedings paper2015, 2015 International Conference on IC Design & Technology (ICICDT), 1/06/2015, p.1-4Publication DTCO flow for device exploration
Meeting abstract2018, SNUG (Synopsys User Group) Europe 2018, 11/06/2018Publication DTCO of Nanosheet and Forksheet Architectures: Exploring Dielectric Walls, Contacting Schemes, and Active Regions for Optimized RO Performance
Proceedings paper2024, 8th Electron Devices Technology & Manufacturing Conference (EDTM), MAR 03-06, 2024, p.226-228Publication Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
;Sakhare, Sushil; ;Huynh Bao, Trong; ; Proceedings paper2018, IEEE International Electron Devices Meeting - IEDM, 1/12/2018, p.420-423Publication Extreme scaling enabled by 5 tracks cells : holistic design-device co-optimization for FinFETs and lateral nanowires
Proceedings paper2016, IEEE International Electron Devices Meeting - IEDM, 3/12/2016, p.687-690Publication Ge Devices: a potential candidate for sub-5nm nodes?
Journal article2019, IEEE Transactions on Electron Devices, (66) 11, p.4997-5002Publication Heterogeneous nano- to wide-scale co-integration of beyond-Si and Si CMOS devices to enhance future electronics
Proceedings paper2015, Silicon Compatible Materials, and Technologies for Advanced Integrated Processes, Circuits and Emerging Applications 5, 29/06/2015, p.3-14
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