Browsing by Author "de Marneffe, Jean-Francois"
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Publication 28nm pitch of line/space pattern transfer into silicon substrates with chemo-epitaxy directed self-assembly (DSA) process flow
Oral presentation2013, 39th International Conference on Micro and Nano Engineering - MNEPublication 2D TMDC aging: a case study of monolayer WS2 and mitigation strategies
Journal article2024, NANOTECHNOLOGY, (35) 47, p.Art. 475702Publication 30-nm half-pitch metal patterning using MotifTM critical dimension shrink technique and double patterning
Journal article2009, Journal of Micro/Nanolithography MEMS MOEMS, (8) 1, p.11007Publication 30nm half-pitch metal patterning using MotifTM CD shrink technique and double patterning
Proceedings paper2008, Optical Microlithography XXI, 24/02/2008, p.69242CPublication A 0.314mm2 6T-SRAM cell built with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithography
Proceedings paper2004-12, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.269-272Publication A DC-pulsed capacitively-coupled planar Langmuir probe for plasma process diagnostics and monitoring
Journal article2012, Plasma Sources Science and Technology, (21) 6, p.65004Publication A metal hardmask approach for the contact patterning of a 0.186 μm² SRAM cell exposed with EUV lithography
Meeting abstract2008, American Vacuum Society Fall Meeting, 19/10/2008Publication A novel low temperature etch approach to reduce ULK plasma damage
Meeting abstract2015, Plasma Etch and Strip in Microtechnology - PESM, 27/04/2015Publication A novel plasma-assisted shrink process to enlarge process windows of narrow trenches and contacts for 45-nm node applications and beyond
; ; ; ; Proceedings paper2007, Advances in Resist Materials and Processing Technology XXIV, 25/02/2007, p.65190UPublication A Novel Volatile Film for Dielectric Plasma Damage Protection
Meeting abstract2019, Plasma Etch and Strip in Microtechnology Workshop - PESM, 20/05/2019Publication A route towards the fabrication of 2D heterostructures using atomic layer etching combined with selective conversion
;Heyne, Markus ;Marinov, Daniil ;Braithwaite, NicholasGoodyear, AndyJournal article2019, 2D Materials, (6) 3, p.35030Publication Adsorption isobars of fluorocarbon compounds for cryogenic plasma etching of low-k dielectrics (in Russian)
Journal article2015, Electronic Engineering, 3, p.49Publication Adsorption isobars of fluorocarbon compounds selected for cryogenic etching of low-k materials
Meeting abstract2015, Spring MRS Meeting Symposium BB: Innovative Interconnects/Electrodes for Advances Devices, Flexible and Green Energy Electronics, 6/04/2015, p.BB2.03Publication Advanced CMOS manufacturing, a drive for plasma science and technology
Proceedings paper2012, 10th Technological Plasma Workshop - TPW, 17/12/2012Publication Advanced etching for nanodevices and 2D materials
Meeting abstract2016, SNM special session at MNE Conference, 19/09/2016Publication Advances and challenges in ultra low-k patterning
Meeting abstract2012, China Semiconductor Technology International Conference - CSTIC, 18/03/2012Publication Alternative integration of ultra low-k dielectrics by template replacement approach
Proceedings paper2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.345-347Publication An experimental study of VUV plasma damage on porous organo-silicon glass materials
Meeting abstract2013-02, SPIE Advanced Lithography Conference: Advanced Etch Technology for Nanopatterning II, 24/02/2013Publication Anisotropic properties of Bi-2201 thin films grown on vicinal substrates
Journal article2005-05, Modern Physics Letters B, (19) 12, p.585-588Publication Applications of cryogenic plasma etching for microtechnology and advanced CMOS manufacturing
Meeting abstract2013, Plasma Etch and Strip in Microtechnology - PESM, 14/03/2013