Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "de Marneffe, Jean-Francois"

Filter results by typing the first few letters
Now showing 1 - 20 of 214
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    28nm pitch of line/space pattern transfer into silicon substrates with chemo-epitaxy directed self-assembly (DSA) process flow

    Chan, BT  
    ;
    Tahara, Shigeru
    ;
    Parnell, Doni
    ;
    Rincon Delgadillo, Paulina  
    ;
    Gronheid, Roel  
    Oral presentation
    2013, 39th International Conference on Micro and Nano Engineering - MNE
  • Loading...
    Thumbnail Image
    Publication

    2D TMDC aging: a case study of monolayer WS2 and mitigation strategies

    Wyndaele, Pieter-Jan  
    ;
    de Marneffe, Jean-Francois  
    ;
    Slaets, R.
    ;
    Groven, Benjamin  
    ;
    Franquet, Alexis  
    Journal article
    2024, NANOTECHNOLOGY, (35) 47, p.Art. 475702
  • Loading...
    Thumbnail Image
    Publication

    30-nm half-pitch metal patterning using MotifTM critical dimension shrink technique and double patterning

    Versluijs, Janko  
    ;
    de Marneffe, Jean-Francois  
    ;
    Goossens, Danny  
    ;
    Vandeweyer, Tom  
    ;
    Wiaux, Vincent  
    Journal article
    2009, Journal of Micro/Nanolithography MEMS MOEMS, (8) 1, p.11007
  • Loading...
    Thumbnail Image
    Publication

    30nm half-pitch metal patterning using MotifTM CD shrink technique and double patterning

    Versluijs, Janko  
    ;
    de Marneffe, Jean-Francois  
    ;
    Goossens, Danny  
    ;
    Op de Beeck, Maaike  
    Proceedings paper
    2008, Optical Microlithography XXI, 24/02/2008, p.69242C
  • Loading...
    Thumbnail Image
    Publication

    A 0.314mm2 6T-SRAM cell built with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithography

    Nackaerts, Axel
    ;
    Ercken, Monique  
    ;
    Demuynck, Steven  
    ;
    Lauwers, Anne  
    ;
    Baerts, Christina  
    Proceedings paper
    2004-12, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.269-272
  • Loading...
    Thumbnail Image
    Publication

    A DC-pulsed capacitively-coupled planar Langmuir probe for plasma process diagnostics and monitoring

    Samara, Vladimir
    ;
    Booth, Jean-Paul
    ;
    de Marneffe, Jean-Francois  
    ;
    Milenin, Alexey  
    ;
    Brouri, Mohand
    Journal article
    2012, Plasma Sources Science and Technology, (21) 6, p.65004
  • Loading...
    Thumbnail Image
    Publication

    A metal hardmask approach for the contact patterning of a 0.186 μm² SRAM cell exposed with EUV lithography

    de Marneffe, Jean-Francois  
    ;
    Goossens, Danny  
    ;
    Vandervorst, Alain
    ;
    Demuynck, Steven  
    Meeting abstract
    2008, American Vacuum Society Fall Meeting, 19/10/2008
  • Loading...
    Thumbnail Image
    Publication

    A novel low temperature etch approach to reduce ULK plasma damage

    Zhang, Liping  
    ;
    de Marneffe, Jean-Francois  
    ;
    Leroy, F.
    ;
    Ljazouli, R.
    ;
    Lefaucheux, P.
    ;
    Tillocher, T
    Meeting abstract
    2015, Plasma Etch and Strip in Microtechnology - PESM, 27/04/2015
  • Loading...
    Thumbnail Image
    Publication

    A novel plasma-assisted shrink process to enlarge process windows of narrow trenches and contacts for 45-nm node applications and beyond

    Op de Beeck, Maaike  
    ;
    Versluijs, Janko  
    ;
    Tokei, Zsolt  
    ;
    Demuynck, Steven  
    ;
    de Marneffe, Jean-Francois  
    Proceedings paper
    2007, Advances in Resist Materials and Processing Technology XXIV, 25/02/2007, p.65190U
  • Loading...
    Thumbnail Image
    Publication

    A Novel Volatile Film for Dielectric Plasma Damage Protection

    de Marneffe, Jean-Francois  
    ;
    Rezvanov, Askar
    ;
    Chanson, Romain
    ;
    Babaei Gavan, Khashayar  
    Meeting abstract
    2019, Plasma Etch and Strip in Microtechnology Workshop - PESM, 20/05/2019
  • Loading...
    Thumbnail Image
    Publication

    A route towards the fabrication of 2D heterostructures using atomic layer etching combined with selective conversion

    Heyne, Markus
    ;
    Marinov, Daniil
    ;
    Braithwaite, Nicholas
    ;
    Goodyear, Andy
    Journal article
    2019, 2D Materials, (6) 3, p.35030
  • Loading...
    Thumbnail Image
    Publication

    Adsorption isobars of fluorocarbon compounds for cryogenic plasma etching of low-k dielectrics (in Russian)

    Rezvanov, A.
    ;
    Gutshin, O.
    ;
    Gornev, E.
    ;
    Krasnikov, G.
    ;
    Mogil'nikov, K.
    ;
    Zhang, Liping  
    Journal article
    2015, Electronic Engineering, 3, p.49
  • Loading...
    Thumbnail Image
    Publication

    Adsorption isobars of fluorocarbon compounds selected for cryogenic etching of low-k materials

    Rezvanov, A.
    ;
    Mogilnikov, K.
    ;
    Gutshin, O.
    ;
    Gornev, E.
    ;
    Krasnikov, G.
    ;
    Zhang, Liping  
    ;
    Dussarrat, C.
    Meeting abstract
    2015, Spring MRS Meeting Symposium BB: Innovative Interconnects/Electrodes for Advances Devices, Flexible and Green Energy Electronics, 6/04/2015, p.BB2.03
  • Loading...
    Thumbnail Image
    Publication

    Advanced CMOS manufacturing, a drive for plasma science and technology

    de Marneffe, Jean-Francois  
    ;
    Altamirano Sanchez, Efrain  
    ;
    Milenin, Alexey  
    ;
    Samara, Vladimir
    Proceedings paper
    2012, 10th Technological Plasma Workshop - TPW, 17/12/2012
  • Loading...
    Thumbnail Image
    Publication

    Advanced etching for nanodevices and 2D materials

    de Marneffe, Jean-Francois  
    ;
    Cooke, Mike
    ;
    Goodyear, Andy
    ;
    Braithwaite, Nicolas
    ;
    Sutton, Yvonne
    Meeting abstract
    2016, SNM special session at MNE Conference, 19/09/2016
  • Loading...
    Thumbnail Image
    Publication

    Advances and challenges in ultra low-k patterning

    Xu, Kaidong
    ;
    Souriau, Laurent  
    ;
    Lazzarino, Frederic  
    ;
    de Marneffe, Jean-Francois  
    Meeting abstract
    2012, China Semiconductor Technology International Conference - CSTIC, 18/03/2012
  • Loading...
    Thumbnail Image
    Publication

    Alternative integration of ultra low-k dielectrics by template replacement approach

    Zhang, Liping  
    ;
    de Marneffe, Jean-Francois  
    ;
    Heylen, Nancy  
    ;
    Murdoch, Gayle  
    ;
    Tokei, Zsolt  
    Proceedings paper
    2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.345-347
  • Loading...
    Thumbnail Image
    Publication

    An experimental study of VUV plasma damage on porous organo-silicon glass materials

    de Marneffe, Jean-Francois  
    ;
    Lukaszewicz, Mikolaj
    ;
    Heyne, Markus
    ;
    Zhang, Liping  
    Meeting abstract
    2013-02, SPIE Advanced Lithography Conference: Advanced Etch Technology for Nanopatterning II, 24/02/2013
  • Loading...
    Thumbnail Image
    Publication

    Anisotropic properties of Bi-2201 thin films grown on vicinal substrates

    Zhang, Y.Z.
    ;
    Wang, Z.
    ;
    Zheng, D.N.
    ;
    Wen, H.H.
    ;
    Zhao, Z.X.
    ;
    de Marneffe, Jean-Francois  
    ;
    Deltour, R.
    Journal article
    2005-05, Modern Physics Letters B, (19) 12, p.585-588
  • Loading...
    Thumbnail Image
    Publication

    Applications of cryogenic plasma etching for microtechnology and advanced CMOS manufacturing

    Dussart, R.
    ;
    Lefaucheux, P.
    ;
    Tillocher, T.
    ;
    Ranson, P.
    ;
    Boufnichel, M.
    ;
    Ljazouli, R.
    ;
    Zhang, Liping  
    Meeting abstract
    2013, Plasma Etch and Strip in Microtechnology - PESM, 14/03/2013
  • «
  • 1 (current)
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • 10
  • 11
  • »

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings