Browsing by Subject "1/F NOISE"
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Publication DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets
Journal article2022, SOLID-STATE ELECTRONICS, 194, p.108360Publication Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
;Li, Kan ;Zhang, En Xia ;Gorchichko, Mariia ;Wang, Peng Fei ;Reaz, MahmudZhao, Simeng E.Journal article2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 5, p.740-747Publication In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets
Journal article2023, SOLID-STATE ELECTRONICS, (201) March, p.Art. 108591Publication Low frequency noise spectroscopy methodology for identifying traps located in the Si film of advanced mosfets
Journal article2026, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (41) 7, p.075011Publication Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
Journal article2023, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (70) 4, p.442-448Publication Low-frequency noise characteristics of waveguide-integrated lateral and vertical Ge-on-Si p-i-n photodiodes
Journal article2025, JOURNAL OF APPLIED PHYSICS, (138) 15, p.155706Publication Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors
;Andrade, Maria Gloria Cano de ;Bergamim, Luis Felipe de OliveiraBaptista Junior, BrazJournal article2021, SOLID-STATE ELECTRONICS, 183, p.108050Publication Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation
Journal article2021, NPJ 2D MATERIALS AND APPLICATIONS, (5) 1, p.4Publication Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
;Luo, Xuyi ;Zhang, En Xia ;Wang, Peng Fei ;Li, Kan; ; Reed, Robert A.Journal article2023, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (23) 1, p.153-161Publication Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
Journal article2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 3, p.299-306Publication Random Telegraph Noise and Radiation Response of 80 nm Vertical Charge-Trapping NAND Flash Memory Devices With SiON Tunneling Oxide
Journal article2024, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (71) 8, p.1789-1797Publication Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs
Journal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 10, p.5860-5866Publication Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 1, p.254-260Publication Signal to noise ratio in nanoscale bioFETs
Journal article2022, SOLID-STATE ELECTRONICS, 194, p.Art. 108358Publication TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
;Bonaldo, Stefano ;Gorchichko, Mariia ;Zhang, En Xia ;Ma, Teng ;Mattiazzo, SerenaBagatin, MartaJournal article2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 7, p.1444-1452Publication Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors
;Gorchichko, Mariia ;Zhang, En Xia ;Wang, Pan ;Bonaldo, StefanoSchrimpf, Ronald D.Journal article2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 5, p.687-696Publication Unraveling the impact of nano-scaling on silicon field-effect transistors for the detection of single-molecules
Journal article2023, NANOSCALE, (15) 5, p.2354-2368