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Browsing by Subject "1/F NOISE"

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    DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets

    Cretu, B.
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    Veloso, Anabela  
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    Simoen, Eddy  
    Journal article
    2022, SOLID-STATE ELECTRONICS, 194, p.108360
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    Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

    Li, Kan
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    Zhang, En Xia
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    Gorchichko, Mariia
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    Wang, Peng Fei
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    Reaz, Mahmud
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    Zhao, Simeng E.
    Journal article
    2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 5, p.740-747
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    In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets

    Cretu, B.
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    Veloso, Anabela  
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    Simoen, Eddy  
    Journal article
    2023, SOLID-STATE ELECTRONICS, (201) March, p.Art. 108591
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    Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

    Li, Kan
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    Luo, Xuyi
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    Rony, M. W.
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    Gorchichko, Mariia
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    Hiblot, Gaspard  
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    Van Huylenbroeck, Stefaan  
    Journal article
    2023, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (70) 4, p.442-448
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    Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors

    Andrade, Maria Gloria Cano de
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    Bergamim, Luis Felipe de Oliveira
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    Baptista Junior, Braz
    Journal article
    2021, SOLID-STATE ELECTRONICS, 183, p.108050
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    Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

    Lee, Kookjin  
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    Nam, Sangjin
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    Ji, Hyunjin
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    Choi, Junhee
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    Jin, Jun-Eon
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    Kim, Yeonsu
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    Na, Junhong
    Journal article
    2021, NPJ 2D MATERIALS AND APPLICATIONS, (5) 1, p.4
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    Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

    Luo, Xuyi
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    Zhang, En Xia
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    Wang, Peng Fei
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    Li, Kan
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    Linten, Dimitri  
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    Mitard, Jerome  
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    Reed, Robert A.
    Journal article
    2023, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (23) 1, p.153-161
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    Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs

    Rony, M. W.
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    Zhang, En Xia
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    Toguchi, Shintaro
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    Luo, Xuyi
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    Reaz, Mahmud
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    Li, Kan
    ;
    Linten, Dimitri  
    Journal article
    2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 3, p.299-306
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    Random Telegraph Noise and Radiation Response of 80 nm Vertical Charge-Trapping NAND Flash Memory Devices With SiON Tunneling Oxide

    Wynocker, Isabella R.
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    Zhang, En Xia
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    Reed, Robert A.
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    Schrimpf, Ronald D.
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    Arreghini, Antonio  
    Journal article
    2024, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (71) 8, p.1789-1797
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    Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs

    Cretu, Bogdan
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    Tahiat, Abderrahim
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    Veloso, Anabela  
    ;
    Simoen, Eddy
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 10, p.5860-5866
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    Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs

    Cretu, Bogdan
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    Veloso, Anabela  
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    Simoen, Eddy
    Journal article
    2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 1, p.254-260
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    Signal to noise ratio in nanoscale bioFETs

    Bergfeld Mori, Carlos  
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    Martens, Koen  
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    Simoen, Eddy  
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    Van Dorpe, Pol  
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    Der Agopian, Paula Ghedini
    Journal article
    2022, SOLID-STATE ELECTRONICS, 194, p.Art. 108358
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    TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

    Bonaldo, Stefano
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    Gorchichko, Mariia
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    Zhang, En Xia
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    Ma, Teng
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    Mattiazzo, Serena
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    Bagatin, Marta
    Journal article
    2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 7, p.1444-1452
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    Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors

    Gorchichko, Mariia
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    Zhang, En Xia
    ;
    Wang, Pan
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    Bonaldo, Stefano
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    Schrimpf, Ronald D.
    Journal article
    2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 5, p.687-696
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    Unraveling the impact of nano-scaling on silicon field-effect transistors for the detection of single-molecules

    Santermans, Sybren  
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    Hellings, Geert  
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    Heyns, Marc  
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    Van Roy, Wim  
    ;
    Martens, Koen  
    Journal article
    2023-01-16, NANOSCALE, (15) 5, p.2354-2368

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