Browsing by author "Zahid, Mohammed"
Now showing items 1-20 of 56
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A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique
Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Simoen, Eddy; Arreghini, Antonio; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2010) -
A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology
Cacciato, Antonio; Breuil, Laurent; Dekkers, Harold; Zahid, Mohammed; Kar, Gouri Sankar; Everaert, Jean-Luc; Schoofs, Geert; Shi, Qixian; Van den Bosch, Geert; Jurczak, Gosia; Debusschere, Ingrid; Van Houdt, Jan; Cockburn, Andrew; Date, Lucien; Xa, Li Qun; Le, Maggie; Lee, Won (2011) -
A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology
Cacciato, Antonio; Breuil, Laurent; Dekkers, Harold; Zahid, Mohammed; Kar, Gouri Sankar; Everaert, Jean-Luc; Schoofs, Geert; Van den Bosch, Geert; Jurczak, Gosia; Debusschere, Ingrid; Van Houdt, Jan; Cockburn, Andrew; Date, Lucien; Xa, Li-Qun; Le, Maggie; Lee, Won (2010) -
Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?
Kauerauf, Thomas; Degraeve, Robin; Zahid, Mohammed; Cho, Moon Ju; Kaczer, Ben; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; De Gendt, Stefan (2005) -
Addressing key concerns for implementation of Ni FUSI into manufacturing for 45/32 nm CMOS
Shickova, Adelina; Kauerauf, Thomas; Rothschild, Aude; Aoulaiche, Marc; Sahhaf, Sahar; Kaczer, Ben; Veloso, Anabela; Torregiani, Cristina; Pantisano, Luigi; Lauwers, Anne; Zahid, Mohammed; Rost, Tim; Tigelaar, H.; Pas, M.; Fretwell, J.; McCormack, J.; Hoffmann, Thomas; Kerner, Christoph; Chiarella, Thomas; Brus, Stephan; Harada, Yoshinao; Niwa, Masaaki; Kaushik, Vidya; Maes, Herman; Absil, Philippe; Groeseneken, Guido; Biesemans, Serge; Kittl, Jorge (2007) -
Advanced electrical characterization toward (sub) 1nm EOT HfSiON – hole trapping in PFET and L-dependent effects
Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; Aoulaiche, Marc; Trojman, Lionel; Ferain, Isabelle; San Andres Serrano, Enrique; Groeseneken, Guido; Zhang, J.F.; Heyns, Marc; Jurczak, Gosia; De Gendt, Stefan (2007) -
Advanced high-k materials and electrical analysis for memories: the role of SiO2-high-k dielectric intermixing
Morassi, L.; Larcher, L.; Pantisano, Luigi; Padovani, A.; Degraeve, Robin; Zahid, Mohammed; O'Sullivan, Barry (2009) -
Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability
Zahid, Mohammed; Ruiz Aguado, Daniel; Degraeve, Robin; Wang, W.C; Govoreanu, Bogdan; Toledano Luque, Maria; Afanasiev, V.V.; Van Houdt, Jan (2010) -
Au-free, high-breakdown AlGaN/GaN MISHEMTs with low leakage, high yield and robust TDDB characteristics
Lenci, Silvia; Kang, Xuanwu; Wellekens, Dirk; Van Hove, Marleen; Boulay, Sanae; Stoffels, Steve; Geens, Karen; Zahid, Mohammed; Decoutere, Stefaan (2012) -
Characterization of hexagonal rare-earth auminates for application in flash memories
Zahid, Mohammed; Degraeve, Robin; Toledano Luque, Maria; Van Houdt, Jan (2011) -
Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection
Toledano-Luque, M.; Pantisano, Luigi; Degraeve, Robin; Zahid, Mohammed; Ferain, Isabelle; San Andres Serrano, Enrique; Groeseneken, Guido; De Gendt, Stefan (2007) -
Comprehensive investigation of on-state stress on D-mode AlGaN/GaN MIS-HEMTs
Wu, Tian-Li; Marcon, Denis; Zahid, Mohammed; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2013) -
Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)
Zahid, Mohammed; Degraeve, Robin; Cho, Moon Ju; Pantisano, Luigi; Van Houdt, Jan; Groeseneken, Guido; Jurczak, Gosia; Ruiz Aguado, Daniel (2009) -
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Zahid, Mohammed; Degraeve, Robin; Tang, Baojun; Lisoni, Judit; Van den Bosch, Geert; Van Houdt, Jan; Breuil, Laurent; Blomme, Pieter; Arreghini, Antonio (2014) -
Defects generation in SiO2/HfO2 studied with variable Tcharge-Tdischarge charge pumping (VT2CP)
Zahid, Mohammed; Degraeve, Robin; Pantisano, Luigi; Zhang, John; Groeseneken, Guido (2007) -
Degradation and breakdown of 0.9 nm EOT SiO2/ ALD HfO2/metal gate stacks under positive constant voltage stress
Degraeve, Robin; Kauerauf, Thomas; Cho, Moon Ju; Zahid, Mohammed; Ragnarsson, Lars-Ake; Brunco, David; Kaczer, Ben; Roussel, Philippe; De Gendt, Stefan; Groeseneken, Guido (2005-12) -
Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
Sahhaf, Sahar; Degraeve, Robin; Cho, Moon Ju; De Brabanter, K.; Roussel, Philippe; Zahid, Mohammed; Groeseneken, Guido (2010-12) -
Effect of high temperature annealing on tunnel oxide properties in TANOS devices
Arreghini, Antonio; Zahid, Mohammed; Van den Bosch, Geert; Suhane, Amit; Breuil, Laurent; Cacciato, Antonio; Van Houdt, Jan (2011) -
Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)
Degraeve, Robin; Cho, Moon Ju; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Van den Bosch, Geert; Van Houdt, Jan; Jurczak, Gosia; Groeseneken, Guido (2009) -
Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing
Zahid, Mohammed; Arreghini, Antonio; Degraeve, Robin; Govoreanu, Bogdan; Suhane, Amit; Van Houdt, Jan (2010)