Browsing by author "Parmentier, Brigitte"
Now showing items 1-19 of 19
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Advanced carrier depth profiling on Si and Ge with M4PP
Clarysse, Trudo; Eyben, Pierre; Parmentier, Brigitte; Van Daele, Benny; Satta, Alessandra; Vandervorst, Wilfried; Lin, Rong; Petersen, Dirch; Folmer Nielsen, Peter (2007) -
Advanced carrier depth profiling on Si and Ge with micro four-point probe
Clarysse, Trudo; Eyben, Pierre; Parmentier, Brigitte; Van Daele, Benny; Satta, Alessandra; Vandervorst, Wilfried; Lin, Rong; Petersen, Dirch H.; Folmer Nielsen, Peter (2008) -
Advanced characterization of carrier profiles in germanium using micro-machined contact probes
Clarysse, Trudo; Konttinen, Mikko; Parmentier, Brigitte; Moussa, Alain; Vandervorst, Wilfried; Impellizzeri, Giuliana; Napolitani, Enrico; Privitera, Vittorio; Nielsen, Peter F.; Petersen, Dirch H.; Hansen, Ole (2012) -
Characterization of epitaxial Si:C:P and SI:P layers for source/drain formation in advanced bulk FinFETs
Rosseel, Erik; Profijt, Harald; Hikavyy, Andriy; Tolle, John; Kubicek, Stefan; Mannaert, Geert; L'abbe, Caroline; Wostyn, Kurt; Horiguchi, Naoto; Clarysse, Trudo; Parmentier, Brigitte; Dhayalan, Sathish Kumar; Bender, Hugo; Maes, Jan; Mehta, Sandeep; Loo, Roger (2014-10) -
Characterization of epitaxial Si:C:P and Si:P layers for source/drain formation in advanced bulk finFETs
Rosseel, Erik; Profijt, Harald; Hikavyy, Andriy; Tolle, John; Kubicek, Stefan; Mannaert, Geert; L'abbe, Caroline; Wostyn, Kurt; Horiguchi, Naoto; Clarysse, Trudo; Parmentier, Brigitte; Dhayalan, Sathish Kumar; Bender, Hugo; Maes, Jan Willem; Loo, Roger (2014-10) -
Hybridization technology for extended-wavelength InGaAs-on-GaAs detector arrays
Zimmermann, Lars; John, Joachim; Borgers, Tom; Parmentier, Brigitte; Song, Lihuan; Van Hoof, Chris; Nemeth, Stefan (2003) -
In-line resistance measurement of single nanometer-wide trenches and fins
Bogdanowicz, Janusz; Parmentier, Brigitte; Schulze, Andreas; Moussa, Alain; Merckling, Clement; Kunert, Bernardette; Guo, Weiming; Porret, Clément; Rosseel, Erik; Hikavyy, Andriy; Hansen, Ole; Petersen, D.H; Henrichsen, H.H.; Nielsen, P.F; Vandervorst, Wilfried (2016) -
MEMS 0-level packaging using thin film poly-SiGe caps
Rusu, Cristina; Verbist, Agnes; Parmentier, Brigitte; Witvrouw, Ann (2002-09) -
Micro probe carrier profiling of ultra-shallow structures in germanium
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Eyben, Pierre; Douhard, Bastien; Vandervorst, Wilfried; Nielsen, Peter; Lin, Rong; Petersen, Dirch; Wang, Fei; Hansen, Ole (2010) -
New low-stress PECVD Poly-SiGe layers for MEMS
Rusu, Cristina; Sedky, S.; Parmentier, Brigitte; Verbist, Agnes; Richard, Olivier; Brijs, Bert; Geenen, Luc; Witvrouw, Ann; Lärmer, F.; Fischer, F.; Kronmüller, S.; Leca, V.; Otter, B. (2003) -
Photo-voltage versus micro-probe sheet resistance measurements on ultra-shallow structures
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Bogdanowicz, Janusz; Cornagliotti, Emanuele; Vandervorst, Wilfried; Bender, Hugo; Pfeffer, Markus; Schellenberger, Martin; Nielsen, Peter; Thorsteinsson, Sune; Lin, Rong; Petersen, Dirch (2009) -
Photovoltage versus microprobe sheet resistance measurements on ultrashallow structures
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Bogdanowicz, Janusz; Vandervorst, Wilfried; Bender, Hugo; Pfeffer, Markus; Schellenberger, Martin; Nielsen, Peter; Thorsteinsson, Sune; Lin, Rong; Petersen, Dirch (2010) -
Planarization of deep trenches
Rusu, Cristina; Klaasse, Gerard; Sedky, Sherif; Esch, Heleen; Parmentier, Brigitte; Verbist, Agnes; Witvrouw, Ann (2001) -
Shallow boron implantations in Ge and the role of the pre-amorphization depth
Simoen, Eddy; Brouwers, Gijs; Satta, Alessandra; David, M.L.; Pailloux, F.; Parmentier, Brigitte; Clarysse, Trudo; Goossens, Jozefien; Vandervorst, Wilfried; Meuris, Marc (2008) -
Surface contamination and electrical damage by focused ion beam: conditions applicable to the extraction of TEM lamellae from nano-electronic devices
Bender, Hugo; Franquet, Alexis; Drijbooms, Chris; Parmentier, Brigitte; Clarysse, Trudo; Vandervorst, Wilfried; Kwakman, Laurens (2015) -
Surface redeposition and damage due to focused ion beam milling
Bender, Hugo; Franquet, Alexis; Drijbooms, Chris; Parmentier, Brigitte; Vandervorst, Wilfried; Kwakman, Laurens (2015) -
The importance of moisture control for EOT scaling of Hf-based dielectrics
Ragnarsson, Lars-Ake; Brunco, David; Yamamoto, Kazuhiko; Tokei, Zsolt; Pourtois, Geoffrey; Delabie, Annelies; Parmentier, Brigitte; Conard, Thierry; Roussel, Philippe; De Gendt, Stefan; Heyns, Marc (2009) -
The project SVAVISCA: a space-variant color CMOS sensor
Sandini, G.; Alaerts, André; Dierickx, Bart; Ferrari, F.; Hermans, Lou; Mannucci, A.; Parmentier, Brigitte; Questa, P.; Meynants, Guy; Scheffer, Danny (1998) -
Why CMOS-integrated transducers? A review.
Witvrouw, Ann; Van Steenkiste, Filip; Maes, Deirdre; Haspeslagh, Luc; Laureyn, Wim; Van Gerwen, Peter; De Moor, Piet; Sedky, Sherif; Van Hoof, Chris; De Vries, Atze; De Caussemaker, A.; Parmentier, Brigitte; Baert, Kris (2000)