Browsing by author "Crupi, Felice"
Now showing items 1-20 of 57
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A defect-centric analysis of the temperature dependence of the channel hot carrier degradation in nMOSFETs
Procel, Luis Miguel; Crupi, Felice; Lionel, Trojman; Franco, Jacopo; Kaczer, Ben (2016) -
A defect-centric perspective on channel hot carrier variability in nMOSFETs
Procel, Luis Miguel; Crupi, Felice; Franco, Jacopo; Trojman, Lionel; Kaczer, Ben; Wils, N.; Tuinhout, H. (2015) -
A new physically-based model for temperature acceleration of time-to-breakdown
Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
A novel methodology for sensing the breakdown location and its application to the reliability study of ultra-thin Hf-silicate gate dielectrics
Crupi, Felice; Kauerauf, Thomas; Degraeve, Robin; Pantisano, Luigi; Groeseneken, Guido (2005-08) -
An inelastic quantum tunnelling model for current conduction after soft-breakdown
Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
Analysis of Signal Processing Methods to Reject the DC Offset Contribution of Static Reflectors in FMCW Radar-Based Vital Signs Monitoring
Mercuri, Marco; Torfs, Tom; Rykunov, Maxim; Laureti, Stefano; Ricci, Marco; Crupi, Felice (2022-12-10) -
Automatic radar-based 2-D localization exploiting vital signs signatures
Mercuri, Marco; Russo, Pietro; Glassee, Miguel; Castro Miller, Ivan Dario; De Greef, Eddy; Rykunov, Maxim; Bauduin, Marc; Bourdoux, André; Ocket, Ilja; Crupi, Felice; Torfs, Tom (2022) -
Border traps in InGaAs nMOSFETs assessed by low-frequency noise
Scarpino, Mercedes; Gupta, Somya; Lin, Dennis; Alian, AliReza; Crupi, Felice; Collaert, Nadine; Thean, Aaron; Simoen, Eddy (2014) -
BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic
Franco, Jacopo; Graziano, Salvatore; Kaczer, Ben; Crupi, Felice; Ragnarsson, Lars-Ake; Grasser, Tibor; Groeseneken, Guido (2012) -
Buried silicon-germanium pMOSFETs: experimental analysis in VLSI logic circuits under aggressive voltage scaling
Crupi, Felice; Alioto, Massimo; Franco, Jacopo; Magnone, Paolo; Kaczer, Ben; Groeseneken, Guido; Mitard, Jerome; Witters, Liesbeth; Hoffmann, Thomas Y. (2012) -
Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown
Crupi, Felice; Degraeve, Robin; Groeseneken, Guido; Nigam, Tanya; Maes, Herman (1998) -
Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current
Crupi, Felice; Iannaccone, G.; Crupi, Isodiana; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (2001) -
Correlation between stress-induced leakage current (SILC) and the HfO2 bulk trap density in a SiO2/HfO2 stack
Crupi, Felice; Degraeve, Robin; Kerber, Andreas; Kwak, Dong Hwa; Groeseneken, Guido (2004-04) -
Defect-centric distribution of channel hot carrier degradation in nano-MOSFETs
Procel, Luis Miguel; Crupi, Felice; Franco, Jacopo; Trojman, Lionel; Kaczer, Ben (2014) -
Early assessment of emerging technologies for VLSI logic circuits from experimental measurements
Crupi, Felice; Magnone, Paolo; Alioto, Massimo; Franco, Jacopo; Groeseneken, Guido (2012) -
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling
Crupi, Felice; Alioto, Massimo; Franco, Jacopo; Magnone, Paolo; Kaczer, Ben; Groeseneken, Guido; Mitard, Jerome; Witters, Liesbeth; Hoffmann, Thomas Y. (2011) -
Experimental evidence of the quantum point contact theory in the conduction mechanism of bipolar HfO2-based resistive random access memories
Procel, Luis Miguel; Trojman, Lionel; Moreno, J.; Crupi, Felice; Maccaronio, V.; Degraeve, Robin; Goux, Ludovic; Simoen, Eddy (2013) -
Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
Magnone, Paolo; Crupi, Felice; Pantisano, Luigi; Pace, Calogero (2007-02) -
Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Magnone, Paolo; Subramanian, Vaidy; Parvais, Bertrand; Mercha, Abdelkarim; Pace, Calogero; Dehan, Morin; Decoutere, Stefaan; Groeseneken, Guido; Crupi, Felice; Pierro, Silvio (2008) -
High-mobility 0.85nm-EOT Si0.45Ge0.55 pFETs: delivering high performance at scaled VDD
Mitard, Jerome; Witters, Liesbeth; Garcia Bardon, Marie; Christie, Phillip; Franco, Jacopo; Mercha, Abdelkarim; Magnone, Paolo; Crupi, Felice; Ragnarsson, Lars-Ake; Hikavyy, Andriy; Vincent, Benjamin; Chiarella, Thomas; Loo, Roger; Tseng, Joshua; Yamaguchi, Shinpei; Takeoka, Shinji; Wang, Wei-E; Absil, Philippe; Hoffmann, Thomas Y. (2010)