Browsing by author "Libezny, Milan"
Now showing items 1-20 of 26
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Analysis of selectively grown epitaxial Si1-xGex by spectroscopic ellipsometry and comparison with other established techniques
Loo, Roger; Caymax, Matty; Libezny, Milan; Blavier, G.; Brijs, Bert; Geenen, Luc; Vandervorst, Wilfried (2000) -
Analysis of selectively grown epitaxial Si1-xGex by spectroscopic ellipsometry and comparison with RBS and SIMS
Loo, Roger; Caymax, Matty; Libezny, Milan; Blavier, G.; Brijs, Bert; Geenen, Luc; Vandervorst, Wilfried (1999) -
b-FeSi2/Heterojunction properties and their depedence on the b-FeSi2 preparation method
Libezny, Milan; Poortmans, Jef; Vermeulen, Tom; Nijs, Johan; Amesz, Peter Henk; Herz, K.; Powalla, M.; Reinsperger, G. U.; Schmidt, M.; Hoffmann, V.; Lange, H. (1995) -
Comparison of bulk and surface passivation properties of plasma nitrides on Si and SiGe solar cells
Said, Khalid; Beaucarne, Guy; Libezny, Milan; Laureys, Wim; Vinckier, Chris; Nijs, Johan; Poortmans, Jef (1997) -
Ellipsometric Determination of the Optical Properties of b-FeSi2
Libezny, Milan; Poortmans, Jef; Vanhellemont, Jan; Nijs, Johan; Piel, J. P.; von Känel, H. (1995) -
Impact of oxygen related extended defects on silicon diode characteristics
Vanhellemont, Jan; Simoen, Eddy; Kaniava, Arvydas; Libezny, Milan; Claeys, C. (1995) -
Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments
Vanhellemont, Jan; Kissinger, G.; Clauws, P.; Kaniava, Arvydas; Libezny, Milan; Gaubas, Eugenijus; Simoen, Eddy; Richter, H.; Claeys, Cor (1996) -
Low temperature selective growth of epitaxial Si and Si1-xGex layers from SiH4 and GeH4 in an ultrahigh vacuum, very low pressure chemical vapour deposition reactor: kinetics and possibilities
Caymax, Matty; Poortmans, Jef; Van Ammel, Annemie; Libezny, Milan; Nijs, Johan; Mertens, Robert (1994) -
Low-temperature passivation for SiGe-alloy solar cells
Said, Khalid; Poortmans, Jef; Libezny, Milan; Caymax, Matty; Nijs, Johan; Mertens, Robert; Vinckier, Chris; Vyncke, Dominique; Seifert, W.; Kittler, M.; Silier, I.; Gutjahr, A.; Konuma, M. (1997) -
Morphologies and growth modes of FeSi and beta-FeSi2 layers prepared by rapid thermal annealing
Amesz, Peter Henk; Jorgensen, L. V.; Libezny, Milan; Poortmans, Jef; Nijs, Johan; van Veen, A.; Schut, H.; de Hosson, J. T. M. (1996) -
On the recombination activity of oxygen precipitation related lattice defects in silicon
Vanhellemont, Jan; Kaniava, Arvydas; Libezny, Milan; Simoen, Eddy; Kissinger, G.; Gaubas, E.; Claeys, C.; Clauws, P. (1995) -
On the relation between low-temperature epitaxial growth conditions and the surface morphology of epitaxial Si and Si1-xGex layers, grown in an ultrahigh vacuum, very low pressure chemical vapour deposition reactor
Caymax, Matty; Poortmans, Jef; Van Ammel, Annemie; Vanhellemont, Jan; Libezny, Milan; Nijs, Johan; Mertens, Robert (1994) -
Optical and electrical studies of silicon-based semiconductors: Si1-x and b-FeSi2
Libezny, Milan (1996-07) -
Photoluminescence determination of the Fermi energy in heavily doped strained Si1-xGex layers
Libezny, Milan; Jain, Suresh; Poortmans, Jef; Caymax, Matty; Nijs, Johan; Mertens, Robert; Werner, K.; Balk, P. (1994) -
PL study of oxygen related defects in silicon
Libezny, Milan; Kaniava, Arvydas; Kissinger, G.; Nijs, Johan; Claeys, Cor; Vanhellemont, Jan (1995) -
RTA-preparation of b-FeSi2 layers from MBE-grown FeSi films deposited on SiGe(100) substrates
Libezny, Milan; Poortmans, Jef; Dekoster, J.; Degroote, S.; Vantomme, Andre; de Lange, B. G. M.; Langouche, G.; Nijs, Johan (1995) -
Simulation of SiGe solar cells with optical confinement and dark current reduction
Said, Khalid; Poortmans, Jef; Libezny, Milan; Nijs, Johan (1997) -
Single Wavelength and Spectroscopic Ellipsometry Characterization of Ultra-Thin Gate Oxides on Silicon and Comparison with Electrical Results
Tonova, Diana; Depas, Michel; Libezny, Milan; Heyns, Marc; Vanhellemont, Jan (1995) -
Solar cell preparation in thin silicon membranes
Libezny, Milan; Poortmans, Jef; Caymax, Matty; Beaucarne, Guy; Laureys, Wim; Nijs, Johan (1997) -
Spectroellipsometric characterisation of thin epitaxial Si1-x Gex layers
Libezny, Milan; Caymax, Matty; Brablec, A.; Kubena, J.; Holy, V.; Poortmans, Jef; Nijs, Johan; Vanhellemont, Jan (1995)