Browsing Conference contributions by title

Extraction of a large set of laser parameters from different measurements

Morthier, Geert; Verhoeve, Piet; Baets, Roel; Schatz, R. (1996)

Extraction of accurate lifetime and doping profiles in Si p-n junction diodes

Simoen, Eddy; Claeys, Cor; Czerwinski, A.; Tomaszewski, D.; Gibki, J.; Bakowski, A.; Katcki, J. (1997)

Extraction of intrinsic charge carrier mobility in organic semiconductors by the gated Van Der Pauw method

Rolin, Cedric; Kang, Enpu; Genoe, Jan; Heremans, Paul (2016)

Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations

Campera, A.; Iannaccone, G.; Crupi, F.; Groeseneken, Guido (2005-04)

Extraction of Roughness Measurements from Thin Resists with Low Signal-to-Noise-Ratio (SNR) SEM Images by Applying Deep Learning Denoiser

Zidan, Mohamed; Dey, Bappaditya; De Simone, Danilo; Severi, Joren; Charley, Anne-Laure; Halder, Sandip; Leray, Philippe; De Gendt, Stefan; Lorusso, Gian (2022)

Extraction of the appropriate material property for realistic modeling of through-silicon-vias using μ-raman spectroscopy

Okoro, Chukwudi; Yang, Yu; Vandevelde, Bart; Swinnen, Bart; Vandepitte, Dirk; Verlinden, Bert; De Wolf, Ingrid (2008)

Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs

Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Martino, Joao Antonio; Sonnenberg, V. (1996)

Extraction of the oxide charge density at front and back interfaces of SOI NMOSFET devices

Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2001)

Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method

Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus (2010)

Extraction of the silicon film thickness on fully depleted SOI nMOSFETs using the black gate influence

Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2000)

Extraordinary inhibition of the field-effect by bound quasiparticles at the interface of a dielectric and the metal-insulatortransition material VO2

Martens, Koen; Jeong, Jae-Woo; Aetukuri, Nagaphani; Rettner, Charles; Shukla, Nikhil; Freeman, Eugene; Esfahani, Davoud; Peeters, Francois; Topuria, Teya; Rice, Phil; Volodin, Alexander; Douhard, Bastien; Vandervorst, Wilfried; Samant, Mahesh; Datta, Suman; Parkin, Stuart (2015)

Extreme scaled gate dielectrics by using ALD Hf-based composite materials

Pierreux, Dieter; Machkaoutsan, Vladimir; Tois, E.; Swerts, Johan; Schram, Tom; Adelmann, Christoph; Van Elshocht, Sven; Tseng, Joshua; Ragnarsson, Lars-Ake; Maes, Jan (2009)

Extreme scaled gate dielectrics by using ALD HfO2/SrTiO3 composite structures

Pierreux, Dieter; Machkaoutsan, Vladimir; Tois, E.; Swerts, Johan; Schram, Tom; Adelmann, Christoph; Van Elshocht, Sven; Popovici, Mihaela Ioana; Conard, Thierry; Tseng, Joshua; Ragnarsson, Lars-Ake; Maes, Jan (2009)

Extreme scaling enabled by 5 tracks cells : holistic design-device co-optimization for FinFETs and lateral nanowires

Garcia Bardon, Marie; Sherazi, Yasser; Schuddinck, Pieter; Jang, Doyoung; Yakimets, Dmitry; Debacker, Peter; Baert, Rogier; Mertens, Hans; Badaroglu, Mustafa; Mocuta, Anda; Horiguchi, Naoto; Mocuta, Dan; Raghavan, Praveen; Ryckaert, Julien; Verkest, Diederik; Steegen, An (2016)

Extreme scaling enabled by MX2 transistors: variability challenges (invited)

Smets, Quentin; Arutchelvan, Goutham; Schram, Tom; Verreck, Devin; Groven, Benjamin; Cott, Daire; Ahmed, Zubair; Shi, Yuanyuan; Sutar, Surajit; Nalin Mehta, Ankit; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana (2021)

Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks

Alves Pereira, Luis Filipe; De Beenhouwer, Jan; Kastner, Johann; Sijbers, Jan (2020)

Extreme spectral transmission fluctuations in silicon nanowires induced by backscattering

Li, Ang; Xing, Yufei; Van Laer, Raphael; Baets, Roel; Bogaerts, Wim (2016-08)

Extreme thinned-wafer bonding using low temperature curable polyimide for advanced waferlevel integrations

Bertheau, Julien; Inoue, Fumihiro; Phommahaxay, Alain; Peng, Lan; Iacovo, Serena; Rassoul, Nouredine; Sleeckx, Erik; Rebibis, Kenneth June; Miller, Andy; Beyer, Gerald; Beyne, Eric; Nakamura, Atsushi (2018)

Extreme thinning of Si wafers for via-last and multi wafer stacking applications

Jourdain, Anne; De Vos, Joeri; Rassoul, Nouredine; Zahedmanesh, Houman; Miller, Andy; Beyer, Gerald; Beyne, Eric; Walsby, Edward; Patel, Jash; Ansell, Oliver; Ashraf, Huma; Thomas, Dave; Li, Shifang; Chang, Timothy; Hiebert, Stephen; Cross, Andrew; Stoerring, Moritz (2018)

Extreme ultraviolet Al(1-x)Ga(x)N photodetectors for future solar missions

Malinowski, Pawel; John, Joachim; Aparicio Alonso, Patricia; Lorenz, Anne; Cheng, Kai; Derluyn, Joff; Germain, Marianne; Borghs, Gustaaf; Mertens, Robert; Duboz, Jean Yves; Kroth, Udo; Richter, Matthias (2008)