Browsing Presentations by imec author "b2d58ce7bd37aa8d6398218af9a9f2fc59b205e7"
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2D profiling with atomic force microscopy
Trenkler, Thomas; De Wolf, Peter; Stephenson, Robert; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
Anisotropic biaxial stress measurements in finFET channels through nano-focused raman spectroscopy
Nuytten, Thomas; Jamal, Muhammad Tahir; Hantschel, Thomas; Bogdanowicz, Janusz; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2016) -
Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques
Minj, Albert; Zhao, Ming; Bakeroot, Benoit; Paredis, Kristof; Wouters, Lennaert; Hantschel, Thomas; Decoutere, Stefaan (2021) -
Automated control of the nanoprober system for nanoscale electrical measurements
Arstila, Kai; Hantschel, Thomas; Nuytten, Thomas (2013) -
Capabilities and limitations of Raman spectroscopy for carbon nanotubes analysis in the micro- and nano-electronics framework
Clemente, Francesca; Richard, Olivier; Hantschel, Thomas; Vandervorst, Wilfried (2007) -
Characterization of the initial stages of boron doped diamond growth in HFCVD
Hantschel, Thomas; Zimmer, Jerry; Chandler, Gerry; Vandervorst, Wilfried (2010) -
Development and optimization of FIB-based sample preparation for SSRM
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2010) -
Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology
Hantschel, Thomas; Cott, Daire; Palanne, Saku; Richard, Olivier; Arstila, Kai; Verhulst, Anne; Schulz, Volker; Eyben, Pierre; Vandervorst, Wilfried (2008) -
Diamond tip based automated two-point electrical probing on the nanoscale
Hantschel, Thomas; Arstila, Kai; Olanterae, Lauri; Vandervorst, Wilfried (2010) -
Diamond tips for electrical probing on the nanometer scale
Hantschel, Thomas; Arstila, Kai; Schulze, Andreas; Eyben, Pierre; Tsigkourakos, Menelaos; Vandervorst, Wilfried (2011) -
Electrical scanning probe techniques in semiconductor research
Trenkler, Thomas; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Stephenson, Robert; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
Extending scanning spreading resistance microscopy towards three-dimensional quantitative carrier mapping in nanowire-based transistors
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2012) -
High resolution dopant/carrier profiling for deep submicron technologies
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; Conard, Thierry; De Witte, Hilde (1999) -
Impact of the non-conductive nano-diamond seed crystals on the electrical conductivity of boron-doped diamond films
Tsigkourakos, Menelaos; Hantschel, Thomas; Simon, Daniel; Vandervorst, Wilfried (2013) -
Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices
Ahmad, Tareq; Devulder, Wouter; Opsomer, Karl; Minjauw, Matthias; Celano, Umberto; Hantschel, Thomas; Vandervorst, Wilfried; Goux, Ludovic; Kar, Gouri Sankar; Detavernier, Christophe (2018) -
Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes
Hantschel, Thomas; Slesazeck, Stefan; Vandervorst, Wilfried (2000) -
Investigation of nanoscopic controlled material removal by doped diamond tips for semiconductor device analysis
Gomes, Oliver; Hantschel, Thomas; Pierre, E.; Vandervorst, Wilfried (2014) -
Nanometer scale carrier profiling with scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo (2001) -
Nanometer scale characterization of deep submicron devices
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1999) -
Nanometer scale characterization of deep submicron devices
Vandervorst, Wilfried; Clarysse, Trudo; Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Trenkler, Thomas; Xu, Mingwei (2000)