Browsing by Author "Bargallo Gonzalez, Mireia"

Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits

Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions

Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions

Analysis of the temperature dependence of trap-assisted-tunneling in Ge pFETs junctions

Carrier lifetime evaluation of electron irradiated SiGe/Si diode

Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

CHC degradation of strained devices based on SiON and high-k gate dielectric materials

Combined IV and CV analysis of laser annealed carbon and boron implanted SiGe epitaxial layers

Combined IV and CV analysis of laser annealed carbon and boron implanted SiGe epitaxial layers

Defect assessment and leakage control in Ge pFET junctions

Defect assessment control and engineering in advanced homo- and hetero-epitaxial device structures

Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

Effects of electron and proton radiation on embedded SiGe source/drain diodes

Effects of electron irradiation on SiGe devices

Elastic relaxation evaluation in SiGe/Si hetero-epitaxial structures

Elastic relaxation evaluation in SiGe/Si hetero-epitaxial structures

Electric field dependence of trap-assisted-tunneling current in strained SiGe source/drain junctions

Electrical activity of dislocations and defects in strained Si and Ge based devices

Electrical activity of dislocations and defects in strained Si and Ge based devices

Electrical defect issues of hetero-epitaxy for advanced nanometric CMOS technologies