Browsing by Author "Dutta, Shibesh"
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Publication 3 omega correction method for eliminating resistance measurement error due to Joule heating
;Guralnik, Benny ;Hansen, Ole ;Henrichsen, Henrik H.Beltran-Pitarch, BraulioJournal article2021, REVIEW OF SCIENTIFIC INSTRUMENTS, (92) 9, p.094711Publication Alternative metals for advanced interconnects
Meeting abstract2014-10, International Conference Micro- and Nanoelectronics - ICMNE, 6/10/2014Publication Alternative metals for advanced interconnects
Oral presentation2015, SEMI Strategic Materials ConferencePublication Alternative metals: from ab initio screening to calibrated narrow line models
Proceedings paper2018, IEEE International Interconnect Technology Conference - IITC, 4/06/2018, p.154-156Publication Atomic layer deposition of ruthenium for advanced interconnect applications
Meeting abstract2016, Materials for Advanced Metalization Conference - MAM, 20/03/2016, p.PMT-08Publication Atomic layer deposition of ruthenium thin films from (ethylbenzyl) (1-ethyl-1,4-cyclohexadienyl) Ru: process characteristics, surface chemistry, and film properties
Journal article2017, Chemistry of Materials, (29) 11, p.4654-4666Publication Atomic layer deposition of ruthenium with TiN interface for sub-10nm advanced interconnects beyond copper
Journal article2016-09, ACS Applied Materials & Interfaces, (9) 39, p.26119-26125Publication Characterization of ultra-thin nickel-silicide films synthesized using the solid state reaction of Ni with an underlying Si:P substrate (P: 0.7 to 4.0%)
Journal article2016, Microelectronic Engineering, 157, p.52-59Publication Direct metal nanowire patterning using ion beam etch
Meeting abstract2017, AVS 64th International Symposium and Exhibition, 29/10/2017, p.PS-WeM13Publication Finite size effects in highly scaled ruthenium interconnects
Journal article2018, IEEE Electron Device Letters, (39) 2, p.268-271Publication Finite Size Effects in Platinum-group Metal Nanostructures
Dutta, ShibeshPHD thesis2018-10Publication Hall effect measurement for precise sheet resistance and thickness evaluation of Ruthenium thin films using non-equidistant four-point probes
;Oesterberg, Frederik Westergaard ;Witthoeft, Maria-LouiseDutta, ShibeshJournal article2018, AIP Advances, (8) 5, p.055206-1-055206-7Publication Highly scaled ruthenium interconnects
Journal article2017, IEEE Electron Device Letters, (38) 7, p.949-951Publication Low-temperature electronic transport properties of ruthenium thin films and nanowires
Journal article2024, PHYSICAL REVIEW B, (110) 19, p.Art. 195431Publication N5 technology node dual-damascene interconnects enabled using multi patterning
Proceedings paper2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3Publication Phase analysis and thermal stability of thin films synthesized via solid state reaction of Ni with Si1-xGex substrate
; ; ;Dutta, Shibesh; ; Journal article2016, Microelectronic Engineering, 149, p.46-51Publication Resistivity scaling model for metals with conduction band anisotropy
Journal article2018, Physical Review Materials, (2) 3, p.033801-01-033801-11Publication Ruthenium interconnects with 58 nm2 cross-section area using a metal-spacer process
Proceedings paper2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3Publication Ruthenium metallization for advanced interconnects
Proceedings paper2016, IEEE International Interconnect Technology Conference / Advanced Metallization Conference - IITC/AMC, 23/05/2016, p.34-36Publication Sub-100 nm2 cobalt interconnects
Journal article2018, IEEE Electron Device Letters, (39) 5, p.731-734