Browsing by Author "Grill, Alexander"

A Compact Physics Analytical Model for Hot-Carrier Degradation

A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays

Analysis of the features of hot-carrier degradation in FinFETs

Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach

Border trap based modeling of SiC transistor transfer characteristics

Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K

CMOS Cryo-Electronics for Quantum Computing

Cold CMOS for Sustainable Datacenters

Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study

Cryogenic Temperature Effects on 16nm FinFet Performance and Mismatch

Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials

Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Gate oxide reliability: upcoming trends, challenges, and opportunities

Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress

Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress