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Browsing by Author "Hansen, Ole"

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    3 omega correction method for eliminating resistance measurement error due to Joule heating

    Guralnik, Benny
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    Hansen, Ole
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    Henrichsen, Henrik H.
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    Beltran-Pitarch, Braulio
    Journal article
    2021, REVIEW OF SCIENTIFIC INSTRUMENTS, (92) 9, p.094711
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    Accurate micro Hall effect measurement on scribe line pads

    Osterberg, Frederik
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    Petersen, Dirch
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    Wang, Fei
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    Rosseel, Erik  
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    Vandervorst, Wilfried  
    Proceedings paper
    2009, 17th Annual IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 29/09/2009
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    Advanced characterization of carrier profiles in germanium using micro-machined contact probes

    Clarysse, Trudo
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    Konttinen, Mikko
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    Parmentier, Brigitte  
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    Moussa, Alain  
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    Vandervorst, Wilfried  
    Proceedings paper
    2012, Ion Implantation Technology. Proceedings of the 19th International Conference, 25/06/2012, p.167-170
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    Apparent size effects on dopant activation in nanometer-wide Si fins

    Folkersma, Steven  
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    Bogdanowicz, Janusz  
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    Favia, Paola  
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    Wouters, Lennaert  
    Journal article
    2021, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, (39) 2, p.Art. 023202
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    Atomic layer deposition of ruthenium with TiN interface for sub-10nm advanced interconnects beyond copper

    Wen, Liang Gong
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    Roussel, Philippe  
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    Varela Pedreira, Olalla  
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    Briggs, Basoene  
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    Groven, Benjamin  
    Journal article
    2016-09, ACS Applied Materials & Interfaces, (9) 39, p.26119-26125
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    Electrical characterization of InGaAs ultra-shallow junctions

    Petersen, Dirch H.
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    Hansen, Ole
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    Bĝggild, Peter
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    Lin, Rong
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    Nielsen, Peter F.
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    Lin, Dennis  
    Journal article
    2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C41-C1C47
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    Electrical characterization of InGaAs ultra-shallow junctions

    Petersen, Dirch H.
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    Hansen, Ole
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    Boggild, Peter
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    Lin, Rong
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    Nielsen, Peter F.
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    Lin, Dennis  
    Proceedings paper
    2009, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 26/04/2009
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    Fast micro Hall effect measurements on small pads

    Ĝsterberg, Frederik Westergaard
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    Petersen, Dirch
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    Nielsen, Peter
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    Rosseel, Erik  
    Journal article
    2011, Journal of Applied Physics, (110) 3, p.33707
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    Hall effect measurement for precise sheet resistance and thickness evaluation of Ruthenium thin films using non-equidistant four-point probes

    Oesterberg, Frederik Westergaard
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    Witthoeft, Maria-Louise
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    Dutta, Shibesh
    Journal article
    2018, AIP Advances, (8) 5, p.055206-1-055206-7
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    High precision micro-scale Hall effect characterization method using in-line micro four-point probes

    Petersen, Dirch
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    Hansen, Ole
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    Lin, Rong
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    Nielsen, P.F.
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    Clarysse, Trudo
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    Goossens, Jozefien
    Proceedings paper
    2008, 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 30/09/2008, p.251-256
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    In-line resistance measurement of single nanometer-wide trenches and fins

    Bogdanowicz, Janusz  
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    Parmentier, Brigitte  
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    Schulze, Andreas
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    Moussa, Alain  
    Proceedings paper
    2016, ECS 230th Fall Meeting: Pacific Rim Meeting - PRiME, 2/10/2016, p.2008
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    In-line sheet resistance measurements of nanometer-wide semiconducting fins

    Bogdanowicz, Janusz  
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    Folkersma, Steven  
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    Schulze, Andreas
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    Moussa, Alain  
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    Merckling, Clement  
    Proceedings paper
    2017, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics - FCMN, 21/03/2017
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    Micro probe carrier profiling of ultra-shallow structures in germanium

    Clarysse, Trudo
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    Moussa, Alain  
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    Parmentier, Brigitte  
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    Eyben, Pierre  
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    Douhard, Bastien  
    Proceedings paper
    2010, Materials and Devices for End-of-Roadmap and Beyond CMOS Scaling, 5/04/2010, p.1252-I05-20
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    Monitoring of local and global temperature non-uniformities by means of Therma-Probe and Micro Four-Point Probe metrology

    Rosseel, Erik  
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    Petersen, Dirch
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    Osterberg, Frederik
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    Hansen, Ole
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    Bogdanowicz, Janusz  
    Proceedings paper
    2009, 17th Annual IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 29/09/2009
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    On the analysis of the activation mechanisms of sub-melt laser anneals

    Clarysse, Trudo
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    Bogdanowicz, Janusz  
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    Goossens, Jozefien
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    Moussa, Alain  
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    Rosseel, Erik  
    Journal article
    2008, Materials Science and Engineering B, 154-155, p.24-30
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    Review of electrical characterization of ultra-shallow junctions with micro four-point probes

    Petersen, Dirch H.
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    Hansen, Ole
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    Hansen, Torben M.
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    Boggild, Peter
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    Lin, Rong
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    Kjaer, Daniel
    Proceedings paper
    2009, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 26/04/2009
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    Review of electrical characterization of ultra-shallow junctions with micro four-point probes

    Petersen, Dirch
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    Hansen, Ole
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    Hansen, Torben
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    Boggild, Peter
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    Lin, Rong
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    Kjaer, Daniel
    Journal article
    2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C27-C1C33
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    Sheet-resistance measurements in nanometer-wide conductive lines

    Bogdanowicz, Janusz  
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    Folkersma, Steven  
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    Sergeant, Stefanie  
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    Schulze, Andreas
    Meeting abstract
    2017, EMRS Spring Meeting Symposium S: Analytical Techniques for Precise Characterization of Nano Materials - ALTECH, 22/05/2017, p.S 6.4
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    Study of submelt laser induced junction nonuniformities using Therma-Probe

    Rosseel, Erik  
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    Bogdanowicz, Janusz  
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    Clarysse, Trudo
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    Vandervorst, Wilfried  
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    Ortolland, Claude
    Journal article
    2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C21-C1C26
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    Systematic study of shallow junction formation on germanium substrates

    Hellings, Geert  
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    Rosseel, Erik  
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    Clarysse, Trudo
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    Petersen, Dirch Hjorth
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    Hansen, Ole
    Journal article
    2011, Microelectronic Engineering, (88) 4, p.347-350
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