Browsing by Author "Hansen, Ole"
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Publication 3 omega correction method for eliminating resistance measurement error due to Joule heating
;Guralnik, Benny ;Hansen, Ole ;Henrichsen, Henrik H.Beltran-Pitarch, BraulioJournal article2021, REVIEW OF SCIENTIFIC INSTRUMENTS, (92) 9, p.094711Publication Accurate micro Hall effect measurement on scribe line pads
Proceedings paper2009, 17th Annual IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 29/09/2009Publication Advanced characterization of carrier profiles in germanium using micro-machined contact probes
Proceedings paper2012, Ion Implantation Technology. Proceedings of the 19th International Conference, 25/06/2012, p.167-170Publication Apparent size effects on dopant activation in nanometer-wide Si fins
Journal article2021, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, (39) 2, p.Art. 023202Publication Atomic layer deposition of ruthenium with TiN interface for sub-10nm advanced interconnects beyond copper
Journal article2016-09, ACS Applied Materials & Interfaces, (9) 39, p.26119-26125Publication Electrical characterization of InGaAs ultra-shallow junctions
Journal article2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C41-C1C47Publication Electrical characterization of InGaAs ultra-shallow junctions
Proceedings paper2009, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 26/04/2009Publication Fast micro Hall effect measurements on small pads
Journal article2011, Journal of Applied Physics, (110) 3, p.33707Publication Hall effect measurement for precise sheet resistance and thickness evaluation of Ruthenium thin films using non-equidistant four-point probes
;Oesterberg, Frederik Westergaard ;Witthoeft, Maria-LouiseDutta, ShibeshJournal article2018, AIP Advances, (8) 5, p.055206-1-055206-7Publication High precision micro-scale Hall effect characterization method using in-line micro four-point probes
;Petersen, Dirch ;Hansen, Ole ;Lin, Rong ;Nielsen, P.F. ;Clarysse, TrudoGoossens, JozefienProceedings paper2008, 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 30/09/2008, p.251-256Publication In-line resistance measurement of single nanometer-wide trenches and fins
Proceedings paper2016, ECS 230th Fall Meeting: Pacific Rim Meeting - PRiME, 2/10/2016, p.2008Publication In-line sheet resistance measurements of nanometer-wide semiconducting fins
Proceedings paper2017, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics - FCMN, 21/03/2017Publication Micro probe carrier profiling of ultra-shallow structures in germanium
Proceedings paper2010, Materials and Devices for End-of-Roadmap and Beyond CMOS Scaling, 5/04/2010, p.1252-I05-20Publication Monitoring of local and global temperature non-uniformities by means of Therma-Probe and Micro Four-Point Probe metrology
Proceedings paper2009, 17th Annual IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 29/09/2009Publication On the analysis of the activation mechanisms of sub-melt laser anneals
Journal article2008, Materials Science and Engineering B, 154-155, p.24-30Publication Review of electrical characterization of ultra-shallow junctions with micro four-point probes
;Petersen, Dirch H. ;Hansen, Ole ;Hansen, Torben M. ;Boggild, Peter ;Lin, RongKjaer, DanielProceedings paper2009, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 26/04/2009Publication Review of electrical characterization of ultra-shallow junctions with micro four-point probes
;Petersen, Dirch ;Hansen, Ole ;Hansen, Torben ;Boggild, Peter ;Lin, RongKjaer, DanielJournal article2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C27-C1C33Publication Sheet-resistance measurements in nanometer-wide conductive lines
Meeting abstract2017, EMRS Spring Meeting Symposium S: Analytical Techniques for Precise Characterization of Nano Materials - ALTECH, 22/05/2017, p.S 6.4Publication Study of submelt laser induced junction nonuniformities using Therma-Probe
Journal article2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C21-C1C26Publication Systematic study of shallow junction formation on germanium substrates
Journal article2011, Microelectronic Engineering, (88) 4, p.347-350