Browsing by Author "Makarov, Alexander"

A Compact Physics Analytical Model for Hot-Carrier Degradation

Analysis of the features of hot-carrier degradation in FinFETs

Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach

Border trap based modeling of SiC transistor transfer characteristics

Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach

Distribution function based simulations of hot-carrier degradation in nanowire FETs

Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs

Full (Vg,Vd) bias space modeling of hot-carrier degradation in nanowire FETs

High-Density Standard Cell Libraries with Backside Power Options in A14 Nanosheet Node

Hot-carrier degradation modeling of decananometer nMOSFETs using the drift-diffusion approach

Impact of the device geometric parameters on hot-carrier degradation in FinFETs

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations

Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors

On correlation between hot-carrier stress induced device parameter degradation and time-zero variability

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective

Physical principles of self-consistent simulation of the generation of interface states and the transport of hot charge carriers in field-effect transistors based on metal–oxide–semiconductor structures

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants