Browsing by Author "Toledano Luque, Maria"
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Publication A comprehensive model for correlated drain and gate current fluctuations
Proceedings paper2013, 16th International Workshop on Computational Electronics - IWCE, 4/06/2013, p.46-47Publication Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF
Journal article2007, IEEE Trans. Electron Devices, (54) 7, p.1705-1712Publication Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
Publication Advanced doping techniques for DRAM peripheral MOSFETs
Meeting abstract2015, E-MRS Spring Meeting Symposuium AA: Non-Volatile Memories: Materials, Nanostructures and Integration Approaches, 11/05/2015, p.AA.V1Publication Analysis of performance/variability trade-off in Macaroni-type 3-D NAND Memory
Proceedings paper2014, IEEE 6th International Memory Workshop, 18/05/2014, p.123-126Publication Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
Meeting abstract2013, 18th Conference of Insulting Films on Semiconductors - INFOS: Book of Abstracts, 25/06/2013, p.164-165Publication Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
Journal article2013, Microelectronic Engineering, 109, p.314-317Publication Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability
Journal article2010, IEEE Transactions on Electron Devices, (57) 11, p.2907-2916Publication As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability
Journal article2014, Microelectronics Reliability, (54) 9_10, p.1675-1679Publication Assessing reliability of nano-scaled CMOS technologies one defect at a time
Proceedings paper2012, IEEE International Conference on Emerging Electronics - ICEE, 15/12/2012Publication Assessment of tunnel oxide and poly-Si channel traps in 3D SONOS memory before and after P/E cycling
Journal article2015, Microelectronic Engineering, 147, p.45-50Publication Atomistic approach to variability of bias-temperature instability in circuit simulations
Proceedings paper2011-04, IEEE International Reliability Physics Symposium - IRPS, 10/04/2011, p.915-919Publication Automatic software for statistical prediction of reading current variability in deeply scaled 3D poly-Si channel SONOS memories
Meeting abstract2012, The 8th International Nanotechnology Conference on Communication and Cooperation, 8/05/2012Publication Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs
Proceedings paper2012, International Electron Devices Meeting - IEDM, 10/12/2012, p.28.3Publication Bias-temperature instability of Si and Si(Ge)-channel sub-1nm EOT p-MOS devices: challenges and solutions
Proceedings paper2013, 20th IEEE International Symposium on the Physicsal and Failure Analysis of Integrated Circuits - IPFA, 15/07/2013, p.41-50Publication BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities
Proceedings paper2014-12, International Electron Device Meeting - IEDM, 15/12/2014, p.828-831Publication Characterization of hexagonal rare-earth auminates for application in flash memories
Proceedings paper2011, IEEE International Reliability Physics Symposium - IRPS, 11/04/2011, p.815-818Publication Characterizing grain size and defect energy distribution in vertical SONOS poly-Si channels by means of a resistive network model
Proceedings paper2013, International Electron Devices Meeting - IEDM, 9/12/2013, p.558-561Publication Comparison of NBTI aging on adder architectures and ring oscillators in the downscaled technologies
Journal article2015, Microprocessors and Microsystems, (39) 8, p.1039-1051