Browsing by Author "Van Hove, Marleen"
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Publication 200 V enhancement-mode p-GaN HEMTs fabricated on 200 mm GaN-on-SOI with trench isolation for monolithic integration
; ;Van Hove, Marleen; ; ;Lempinen, Vesa-PekkaSormunen, JaakkoJournal article2017, IEEE Electron Device Letters, (38) 7, p.918-921Publication 200 V enhancement-mode p-GaN HEMTs fabricated on 200 mm GaN-on-SOI with trench isolation for monolithic integration
; ;Van Hove, Marleen; ; ;Lempinen, Vesa-PekkaSormunen, JaakkoProceedings paper2017, 41st Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 21/05/2017, p.103-104Publication 2kV breakdown voltage GaN-on-Si DHFETs with sub-micron thick AlGaN Buffer
Proceedings paper2012, International Conference on Compound Semiconductor MANufacturing TECHnology - MANTECH, 23/04/2012Publication A 0.314mm2 6T-SRAM cell built with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithography
Proceedings paper2004-12, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.269-272Publication A 96% efficient high-frequency DC–DC converter using E-mode GaN DHFETs on Si
;Das, Jo ;Everts, Jordi ;Van den Keybus, Jeroen ;Van Hove, MarleenVisalli, DomenicaJournal article2011, IEEE Electron Device Letters, (32) 10, p.1370-1372Publication A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
;Watté, J. ;Wuyts, Koen ;Silverans, R. E. ;Van Hove, MarleenVan Rossum, MarcJournal article1994, Journal of Applied Physics, 75, p.2055-2060Publication A comprehensive reliability investigation of the voltage-, temperature- and device geometry-dependence of the gate degradation on state-of-the-art GaN-on-Si HEMTs
Proceedings paper2010-12, IEEE International Electron Device Meeting - IEDM, 6/12/2010, p.472-472Publication A deep-level analysis of Ni-Au/AlN(111) p-Si metal-insulator-semiconductor capacitors
Journal article2011, Journal of Physics D: Applied Physics, (44) 47, p.475104Publication A low thermal budget pre metal dielectric stack using PECVD and HDP processing
Oral presentation2001, 7th International Dielectrics & Conductors for ULSI Multilevel Interconnection Conference (DCMIC) and ExhibitionPublication A new approach for the measurement of resistivity and cross-sectional area of an aluminium interconnect line: principle and applications
Proceedings paper1998, Advanced Metallization and Interconnect Systems for ULSI Applications in 1997, 30/09/1997, p.197-204Publication A new ultra-low K ILD material based on organic-inorganic hybrid resins
;Zhong, Ben ;Meynen, Herman ;Iacopi, Francesca ;Weidner, Ken ;Malhouitre, StéphaneMoyer, EricProceedings paper2002, Silicon Materials - Processing, Characterization, and Reliability, 1/04/2002, p.B12.4Publication A theoretical and experimental study of atomic-layer-deposited films onto porous dielectric substrates
Journal article2005-10, Journal of Applied Physics, (98) 8, p.083515-1-083515-9Publication Advanced solutions for copper and low k technology
Oral presentation2000, Semicon Europe; 2000; München, Germany.Publication AlGaN/GaN/AlGaN double heterostructure FETs for power electronics applications
;Srivastava, Puneet ;Das, Jo ;Visalli, Domenica ;Van Hove, MarleenDerluyn, JoffMeeting abstract2010, Young Researchers Symposium 2010 organized by IEEE Joint IAS- PELS-PES Chapter Benelux, 29/03/2010Publication AlGaN/GaN/AlGaN double heterostructures grown on 200 mm silicon(111) substrates with high electron mobility
Journal article2012, Applied Physics Express, (5) 1, p.011002-1Publication AlGaN/GaN/AlGaN double heterostructures on 4 inch Si substrates for high breakdown voltage field-effect transistors with low on-resistance
;Visalli, Domenica ;Derluyn, Joff ;Degroote, Stefan ;Leys, Maarten ;Cheng, KaiGermain, MarianneProceedings paper2008, 40th International Conference on Solid State Devices and Materials - SSDM, 23/09/2008Publication AlGaN/GaN/AlGaN double heterostructures on silicon substrates for high breakdown voltage field-effect transistors with low on-resistance
;Visalli, Domenica ;Van Hove, Marleen ;Derluyn, Joff ;Degroote, Stefan ;Leys, MaartenCheng, KaiJournal article2009, Japanese Journal of Applied Physics, (48) 4, p.04C101Publication AlN/AlGaN/GaN wafer optimization on silicon (111): bow and crystal quality control for Si-CMOS fabs
Journal article2014, Physica Status Solidi C, (11) 3_4, p.450-453Publication An investigation of ultra low-k dielectrics with high thermal stability for integration in memory devices
Journal article2007, Microelectronic Engineering, (84) 11, p.2582-2586Publication Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation
Journal article2015, Solid-State Electronics, 113, p.9-14