Browsing by author "Simons, Veerle"
Now showing items 1-20 of 31
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3D stacking induced mechanical stress effects
Cherman, Vladimir; Van der Plas, Geert; De Vos, Joeri; Ivankovic, Andrej; Lofrano, Melina; Simons, Veerle; Gonzalez, Mario; Vanstreels, Kris; Wang, Teng; Daily, Robert; Guo, Wei; Beyer, Gerald; La Manna, Antonio; De Wolf, Ingrid; Beyne, Eric (2014) -
A spectroscopic study of the chromatic properties of GafChromic EBT3 films
Callens, Maarten; Crijns, Wouter; Simons, Veerle; De Wolf, Ingrid; Depuydt, Tom; Maes, Frederik; Haustermans, Karin; D'hooge, Jan; D'Agostino, Emiliano; Wevers, Martine; Pfeiffer, Helge; Van Den Abeele, Koen (2016) -
A study of blister formation in ALD Al2O3 grown on silicon
Vermang, Bart; Goverde, Hans; Simons, Veerle; De Wolf, Ingrid; Meersschaut, Johan; Tanaku, Shuji; John, Joachim; Poortmans, Jef; Mertens, Robert (2012) -
Assessment of critical Co electromigration parameters
Varela Pedreira, Olalla; Lofrano, Melina; Zahedmanesh, Houman; Roussel, Philippe; van der Veen, Marleen; Simons, Veerle; Chery, Emmanuel; Ciofi, Ivan; Croes, Kristof (2022) -
Comparison of x-ray diffraction, wafer curvature and Raman spectroscopy to evaluate the stress evolution in Copper TSV's
Wilson, Chris; De Wolf, Ingrid; Vandevelde, Bart; De Messemaeker, Joke; Ablett, James M.; Redolfi, Augusto; Simons, Veerle; Beyne, Eric; Croes, Kristof (2012) -
Consistent model for short-channel NMOSFET after hard gate oxide breakdown
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Simons, Veerle; Groeseneken, Guido (2002) -
Creep as a reliability problem in MEMS
Modlinski, Robert; Witvrouw, Ann; Ratchev, Petar; Jourdain, Anne; Simons, Veerle; Tilmans, Harrie; den Toonder, Jaap M.J.; Puers, Bob; De Wolf, Ingrid (2004) -
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility Transistors
Eneman, Geert; Simoen, Eddy; Delhougne, Romain; Gaubas, Eugenijus; Simons, Veerle; Roussel, Philippe; Verheyen, Peter; Lauwers, Anne; Loo, Roger; Vandervorst, Wilfried; De Meyer, Kristin; Claeys, Cor (2004) -
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility transistors
Eneman, Geert; Simoen, Eddy; Delhougne, Romain; Gaubas, Eugenijus; Simons, Veerle; Roussel, Philippe; Verheyen, Peter; Lauwers, Anne; Loo, Roger; Vandervorst, Wilfried; De Meyer, Kristin; Claeys, Cor (2005) -
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors
Croes, Kristof; Simons, Veerle; Truijen, Brecht; Roussel, Philippe; Van Sever, Koen; Tsiara, Artemisia; Franco, Jacopo; Absil, Philippe (2022) -
Design issues and cosiderations for low-cost 3D TSV IC technology
Van der Plas, Geert; Limaye, Paresh; Mercha, Abdelkarim; Oprins, Herman; Torregiani, Cristina; Thijs, Steven; Linten, Dimitri; Stucchi, Michele; Guruprasad, Katti; Velenis, Dimitrios; Shinichi, Domae; Cherman, Vladimir; Vandevelde, Bart; Simons, Veerle; De Wolf, Ingrid; Labie, Riet; Perry, Dan; Bronckers, Stephane; Minas, Nikolaos; Cupak, Miroslav; Ruythooren, Wouter; Van Olmen, Jan; Phommahaxay, Alain; de Potter de ten Broeck, Muriel; Opdebeeck, Ann; Rakowski, Michal; De Wachter, Bart; Dehan, Morin; Nelis, Marc; Agarwal, Rahul; Dehaene, Wim; Travaly, Youssef; Marchal, Pol; Beyne, Eric (2010) -
Determination of stress in shallow trench isolation for deep submicron MOS devices by UV Raman spectroscopy
Dombrowski, Kai; Fischer, A.; Dietrich, B.; De Wolf, Ingrid; Bender, Hugo; Pochet, Sandrine; Simons, Veerle; Rooyackers, Rita; Badenes, Gonçal; Stuer, Cindy; Van Landuyt, J. (1999) -
Determining Si composition in SiGe alloys with <1% Si concentrations using Raman spectroscopy
De Wolf, Ingrid; Simons, Veerle; Srinivasan, Ashwyn; Verheyen, Peter; Loo, Roger (2018) -
Determining Si composition in SiGe alloys with <1% Si concentrations using Raman spectroscopy
De Wolf, Ingrid; Simons, Veerle; Srinivasan, Ashwyn; Verheyen, Peter; Loo, Roger (2018) -
Effects of packaging on mechanical stress in 3D-ICs
Cherman, Vladimir; Lofrano, Melina; Simons, Veerle; Gonzalez, Mario; Van der Plas, Geert; De Vos, Joeri; Wang, Teng; Daily, Robert; Salahouelhadj, Abdellah; Beyer, Gerald; La Manna, Antonio; De Wolf, Ingrid; Beyne, Eric (2015) -
Electromigration Performance Improvement of Metal Heaters for Si Photonic Ring Modulators
Coenen, David; Croes, Kristof; Tsiara, Artemisia; Oprins, Herman; Simons, Veerle; Varela Pedreira, Olalla; Ban, Yoojin; Van Campenhout, Joris; De Wolf, Ingrid (2022-07-01) -
Fabrication and reliability testing of Ti/TiN heaters
De Moor, Piet; Witvrouw, Ann; Simons, Veerle; De Wolf, Ingrid (1999) -
High resolution stress and temperature measurements in semiconductor devices using micro-Raman spectroscopy
De Wolf, Ingrid; Chen, Jian; Rasras, Mahmoud; van Spengen, Merlijn; Simons, Veerle (1999) -
Highly reliable and extremely stable SiGe micro-mirrors
Gromova, Maria; Haspeslagh, Luc; Verbist, Agnes; Du Bois, Bert; Van Hoof, Rita; Eyckens, Brenda; Sijmus, Bram; De Wolf, Ingrid; Simons, Veerle; Muller, Philippe; Lauwagie, Tom; Willegems, Myriam; Locorotondo, Sabrina; Boullart, Werner; Baert, Kris; Witvrouw, Ann (2007-01) -
Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001)