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Low temperature Ge:B and GeSn:B source/drain for Ge pMOS devices: in-situ and conformal B-doping, selectivity towards oxide & nitride with no need for any post-epi activation treatment
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Low temperature Ge:B and GeSn:B source/drain for Ge pMOS devices: in-situ and conformal B-doping, selectivity towards oxide & nitride with no need for any post-epi activation treatment
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vohra, Anurag
;
Porret, Clément
;
Kohen, David
;
Folkersma, Steven
;
Bogdanowicz, Janusz
;
Schaekers, Marc
;
Tolle, John
;
Hikavyy, Andriy
;
Capogreco, Elena
;
Witters, Liesbeth
;
Langer, Robert
;
Vandervorst, Wilfried
;
Loo, Roger
Journal
Japanese Journal of Applied Physics
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2017
since deposited on 2021-10-27
Acq. date: 2026-07-16
Citations
Statistics
Views
2017
since deposited on 2021-10-27
Acq. date: 2026-07-16
Citations