Browsing by Author "Lukyanchikova, N."

Back and front interface related generation-recombination noise in buried-channel SOI p-MOSFET's

Back-gate induced noise overshoot in partially-depleted SOI MOSFETs

Behavior of the 1/f noise and electron mobility in 65 nm FD SOI nMOSFETs employing different tensile-strain-inducing techniques

Black-gate induced noise overshoot in partially-depleted SOI MOSFETs

Critical discussion of the front-back gate coupling effect on the low-frequency noise in fully depleted SOI MOSFETs

Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs

Electrical characterisation of shallow cobalt-silicided junctions

Electrical characterization of shallow cobalt-silicided junctions

Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs

Evidence for a "linear kink effect" in ultra-thin gate oxide SOI MOSFETs

Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias

Explaining the parameters of the electron valence-band tunneling related lorentzian noise in fully depleted SOI MOSFET's

Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs

Flicker noise in deep submicron nMOS transistors

Flicker noise in submicron MOSFETS with 3.5 nm nitrided gate oxide

Identification of isolation-edge related random telegraph signals in submicron silicon metal-oxide-semiconductor transistors

Impact of the back-gate bias on the low-frequency noise of fully depleted silicon-on-insulator MOSFETs

Influence of an accumulation back-gate voltage on the low-frequency noise spectra of 0.13 μm fully-depleted SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

Influence of the accumulation back-gate voltage on the noise spectra of deep submicron SOI MOSFET's in a wide range of drain voltages

Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs