Browsing by Author "Phommahaxay, Alain"
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Publication 10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process
Proceedings paper2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622Publication 2D material integration in the semiconductor industry: Challenges and Solutions
Meeting abstract2019, Graphene week 2019, 23/09/2019Publication 2D materials: roadmap to CMOS integration
Proceedings paper2018, IEEE Electron Devices Meeting - IEDM, 1/12/2018, p.512-515Publication 300mm wafer thinning and backside passivation compatibility with temporary wafer bonding for 3D stacked IC applications
Meeting abstract2010-11, IEEE International 3D System Integration Conference - 3DIC, 16/11/2010Publication A 60GHz silicon micromachined cavity resonator with integrated tuning MEMS array
Proceedings paper2009, MEMSWAVE Symposium, 6/07/2009, p.27-30Publication A MEMS 0-level packaging technology based on CuSn/Cu chip capping bonding
Proceedings paper2011, 22nd Micromechanics and Micro systems Europe Workshop - MME, 19/06/2011, p.B27Publication A novel fan-out concept for ultra-high chip-to-chip interconnect density with 20-μm pitch
Proceedings paper2018, 68th Electronic Components and Technology Conference - ECTC, 29/05/2018, p.370-378Publication A novel method for characterization of Ultra Low Viscosity NCF layers using TCB for 3D Assembly
Meeting abstract2020, IMAPS 53rd International Symposium on Microelectronics, 6/10/2020Publication A Study of SiCN Wafer-to-Wafer Bonding and Impact of Wafer Warpage
; ; ; ; ;Uhrmann, ThomasPlach, ThomasProceedings paper2023, IEEE 73rd Electronic Components and Technology Conference (ECTC), MAY 30-JUN 02, 2023, p.1410-1417Publication A unique temporary bond solution based on a thermoplastic material tacky at room temperature and highly thermally resistant application extension from 3D-SIC to FO-WLP
Oral presentation2017, Electronic Components and Technology Conference - ECTCPublication Acoustic modulation during laser debonding of collective hybrid bonded dies
Proceedings paper2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.2126-2133Publication Advanced dicing technologies for combination of wafer to wafer and collective die to wafer fusion bonding
Proceedings paper2019, 2019 IEEE 69th Electronic Components and Technology Conference (ECTC), 28/05/2018, p.437Publication Advances in SiCN-SiCN bonding with high accuracy wafer-to-wafer (W2W) stacking technology
Proceedings paper2018, IEEE International Interconnect Technology Conference - IITC, 4/06/2018, p.985-992Publication Advances in temporary carrier technology for high density fan-out device build-up
Proceedings paper2019, 2019 IEEE 69th Electronic Components and Technology Conference (ECTC), 28/05/2019, p.340-345Publication Advances in thin wafer debonding and ultra thin 28nm FinFET substrate transfer
Meeting abstract2017, IEEE 67th Electronic Components and Technology Conference - ECTC, 30/05/2017, p.740-745Publication Carrier Systems for Collective Die-to-Wafer Bonding
Proceedings paper2022, 72nd IEEE Electronic Components and Technology Conference (ECTC), MAY 31-JUN 01, 2022, p.2058-2063Publication Challenges and solutions on pre-assembly processes for thinned 3D wafers with micro-bumps on the backside
Proceedings paper2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.75-79Publication Characterization of bonding activation sequences to enable ultra-low Cu/SiCN wafer level hybrid bonding
;Iacovo, Serena ;Peng, Lan ;Nagano, Fuya ;Uhrmann, Thomas ;Burggraf, JurgenFehkuhrer, AndreasProceedings paper2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.2097-2104Publication Characterization of inorganic dielectric layers for low thermal budget wafer to wafer bonding
Proceedings paper2017, 5th International Workshop on Low Temperature Bonding for 3D Integration - LTB-3D, 16/05/2017, p.24Publication Characterization of silicon carbon nitride for low temperature wafer-to-wafer direct bonding
Meeting abstract2020, PRiME 2020: Semiconductor Wafer Bonding: Science, Technology, and Applications 16, 4/10/2020, p.G01-1650