Browsing by author "Lee, Jae Woo"
Now showing items 1-20 of 26
-
1/f noise analysis of replacement metal gate bulk p-type fin field effect transistor
Lee, Jae Woo; Cho, Moon Ju; Simoen, Eddy; Ritzenthaler, Romain; Togo, Mitsuhiro; Boccardi, Guillaume; Mitard, Jerome; Ragnarsson, Lars-Ake; Chiarella, Thomas; Veloso, Anabela; Horiguchi, Naoto; Thean, Aaron; Groeseneken, Guido (2013-03) -
Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra
Simoen, Eddy; Lee, Jae Woo; Claeys, Cor (2014) -
Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm
Choi, Seoyeon; Park, Dong Geun; Kim, Min Jung; Bang, Seain; Kim, Jungchun; Jin, Seunghee; Huh, Ki Seok; Kim, Donghyun; Mitard, Jerome; Han, Cheol E.; Lee, Jae Woo (2023) -
Automatic prediction of MOSFETs threshold voltage by machine learning algorithms
Choi, Seoyeon; Park, Dong Geun; Kim, Min Jung; Bang, Seain; Kim, Jungchun; Jin, Seunghee; Huh, Ki Seok; Kim, Donghyun; Kim, Sanghyeok; Yoon, Inkyu; Mitard, Jerome; Han, Cheol E.; Lee, Jae Woo (2023) -
Bulk FinFET Fin height control using Gas Cluster Ion Beam (GCIB) - Location Specific Processing (LSP)
Kim, Min-Soo; Ritzenthaler, Romain; Everaert, Jean-Luc; Fernandez, Luis; Devriendt, Katia; Lee, Jae Woo; Redolfi, Augusto; Mertens, Sofie; Burke, Ed; Horiguchi, Naoto; Thean, Aaron (2013) -
Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FET
Kim, Soohyun; Kim, Jungchun; Jang, Doyoung; Ritzenthaler, Romain; Parvais, Bertrand; Mitard, Jerome; Mertens, Hans; Chiarella, Thomas; Horiguchi, Naoto; Lee, Jae Woo (2020) -
Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Lee, Kookjin; Ji, Hyunjin; Kim, Yanghee; Kaczer, Ben; Lee, Hyebin; Ahn, Jae-Pyoung; Choi, Junhee; Grill, Alexander; Panarella, Luca; Smets, Quentin; Verreck, Devin; Van Beek, Simon; Vaisman Chasin, Adrian; Linten, Dimitri; Na, Junhong; Lee, Jae Woo; De Wolf, Ingrid; Kim, Gyu-Tae (2022) -
Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET
Lee, Kookjin; Kim, Yeonsu; Lee, Hyebin; Park, Sojeong; Lee, Yongwoo; Joo, Min-Kyu; Ji, Hyunjin; Lee, Jaewoo; Chun, Jungu; Sung, Moonsoo; Cho, Young-Hoon; Kim, Doyoon; Choi, Junhee; Lee, Jae Woo; Jeon, Dae-Young; Choi, Sung-Jin; Kim, Gyu-Tae (2021) -
Heated implantation with amorphous carbon CMOS mask for scaled FinFETs
Togo, Mitsuhiro; Sasaki, Yuichiro; Zschaetzsch, Gerd; Boccardi, Guillaume; Ritzenthaler, Romain; Lee, Jae Woo; Khaja, Fareen; Colombeau, Benjamin; Godet, Ludovic; Martin, Patrick; Brus, Stephan; Altamirano Sanchez, Efrain; Mannaert, Geert; Dekkers, Harold; Hellings, Geert; Horiguchi, Naoto; Vandervorst, Wilfried; Thean, Aaron (2013) -
Heated implantation with amorphous carbon CMOS mask for scaled FinFETs
Togo, Mitsuhiro; Sasaki, Yuichiro; Zschaetzsch, Gerd; Boccardi, Guillaume; Ritzenthaler, Romain; Lee, Jae Woo; Khaja, F.; Colombeau, B.; Godet, L.; Martin, P.; Brus, Stephan; Altamirano Sanchez, Efrain; Mannaert, Geert; Dekkers, Harold; Hellings, Geert; Horiguchi, Naoto; Vandervorst, Wilfried; Thean, Aaron (2013) -
Impact of multi-gate device architectures on digital and analog circuits and its implications on system-on-chip technologies
Thean, Aaron; Wambacq, Piet; Lee, Jae Woo; Cho, Moon Ju; Veloso, Anabela; Sasaki, Yuichiro; Chiarella, Thomas; Miyaguchi, Kenichi; Parvais, Bertrand; Garcia Bardon, Marie; Schuddinck, Pieter; Kim, Min-Soo; Horiguchi, Naoto; Dehan, Morin; Mercha, Abdelkarim; Van der Plas, Geert; Collaert, Nadine; Verkest, Diederik (2013) -
Improved channel hot carrier reliability in p-FinFETs with replacement metal gate by a nitrogen post deposition anneal process
Cho, Moon Ju; Arimura, Hiroaki; Lee, Jae Woo; Kaczer, Ben; Veloso, Anabela; Boccardi, Guillaume; Ragnarsson, Lars-Ake; Kauerauf, Thomas; Horiguchi, Naoto; Groeseneken, Guido (2014-03) -
Improved sidewall doping with small implant angle by AsH3 Ion assisted deposition and doping process for scaled NMOS Si bulk FinFETs
Sasaki, Yuichiro; Godet, Ludovic; Chiarella, Thomas; Brunco, David; Rockwell, Tyler; Lee, Jae Woo; Colombeau, Benjamin; Togo, Mitsuhiro; Chew, Soon Aik; Zschaetzsch, Gerd; Noh, Kyung Bong; De Keersgieter, An; Boccardi, Guillaume; Kim, Min-Soo; Hellings, Geert; Martin, Patrick; Vandervorst, Wilfried; Thean, Aaron; Horiguchi, Naoto (2013) -
Low frequency noise analysis for post-treatment of replacement metal gate FinFET
Lee, Jae Woo; Simoen, Eddy; Veloso, Anabela; Cho, Moon Ju; Arimura, Hiroaki; Boccardi, Guillaume; Ragnarsson, Lars-Ake; Chiarella, Thomas; Horiguchi, Naoto; Thean, Aaron; Groeseneken, Guido (2013) -
Low frequency noise performance of gate-first and replacement metal gate CMOS technologies
Claeys, Cor; Lee, Jae Woo; Simoen, Eddy; Veloso, Anabela; Horiguchi, Naoto; Paraschiv, Vasile (2013) -
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal gate pMOSFETs
Simoen, Eddy; Lee, Jae Woo; Veloso, Anabela; Paraschiv, Vasile; Horiguchi, Naoto; Claeys, Cor (2014) -
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs
Simoen, Eddy; Lee, Jae Woo; Veloso, Anabela; Paraschiv, Vasile; Horiguchi, Naoto; Claeys, Cor (2013) -
Mobility analysis of surface roughness scattering in FinFET devices
Lee, Jae Woo; Jang, Doyoung; Mouis, Mireille; Kim, Gyu Tae; Chiarella, Thomas; Hoffmann, Thomas Y.; Ghibaudo, Gérard (2011) -
Modeling and Understanding the Compact Performance of h-BN Dual-Gated ReS2 Transistor
Lee, Kookjin; Choi, Junhee; Kaczer, Ben; Grill, Alexander; Lee, Jae Woo; Van Beek, Simon; Bury, Erik; Diaz Fortuny, Javier; Vaisman Chasin, Adrian; Lee, Jaewoo; Chun, Jungu; Shin, Dong Hoon; Na, Junhong; Cho, Hyeran; Lee, Sang Wook; Kim, Gyu-Tae (2021) -
Performance and reliability of high-mobility Si0.55Ge0.45 p-channel FinFETs based on epitaxial cladding of Si fins
Mertens, Hans; Ritzenthaler, Romain; Hikavyy, Andriy; Franco, Jacopo; Lee, Jae Woo; Brunco, David; Eneman, Geert; Witters, Liesbeth; Mitard, Jerome; Kubicek, Stefan; Devriendt, Katia; Tsvetanova, Diana; Milenin, Alexey; Vrancken, Christa; Geypen, Jef; Bender, Hugo; Groeseneken, Guido; Vandervorst, Wilfried; Barla, Kathy; Collaert, Nadine; Horiguchi, Naoto; Thean, Aaron (2014)