Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Gate-all-around NWFETs vs. triple-gate FinFETs: junctionless vs. extensionless and conventional junction devices with controlled EWF modulation for multi-VT CMOS
Publication:
Gate-all-around NWFETs vs. triple-gate FinFETs: junctionless vs. extensionless and conventional junction devices with controlled EWF modulation for multi-VT CMOS
Copy permalink
Date
2015
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Veloso, Anabela
;
Hellings, Geert
;
Cho, Moon Ju
;
Simoen, Eddy
;
Devriendt, Katia
;
Paraschiv, Vasile
;
Vecchio, Emma
;
Tao, Zheng
;
Versluijs, Janko
;
Souriau, Laurent
;
Dekkers, Harold
;
Brus, Stephan
;
Geypen, Jef
;
Lagrain, Pieter
;
Bender, Hugo
;
Eneman, Geert
;
Matagne, Philippe
;
De Keersgieter, An
;
Fang, W.
;
Collaert, Nadine
;
Thean, Aaron
Journal
Abstract
Description
Metrics
Views
2000
since deposited on 2021-10-23
Acq. date: 2026-01-09
Citations
Metrics
Views
2000
since deposited on 2021-10-23
Acq. date: 2026-01-09
Citations