Browsing by Author "De Santi, Carlo"

Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization

Degradation of GaN-HEMTs with p-GaN Gate: Dependence on temperature and on geometry

Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors

Exploration of gate trench module for vertical GaN devices

Gate module study for performance improvement in vertical GaN device

Modeling of gate capacitance of GaN-based trench-gate vertical metal-oxide-semiconductor devices

Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs

Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices

Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness

The 2018 GaN power electronics roadmap

Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p(+)n(-)n Diodes: The Road to Reliable Vertical MOSFETs

Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

Use of bilayer gate insulator in GaN-on-Si vertical trench MOSFETs: Impact on performance and reliability

Vertical GaN devices: Process and reliability