Browsing by Author "Meneghini, M."

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

Dynamic-ron control via proton irradiation in AlGaN/GaN transistors

ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping

High-Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps

Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors

Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors

Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs

IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors

On the origin of the leakage current in p-gate AlGaN/GaN HEMTs

Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements

Study and characterization of GaN MOS capacitors: Planar vs trench topographies

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications

μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate