Browsing by Author "Pantisano, Luigi"

1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

85nm-wide 1.5mA/μm-ION IFQW SiGe-pFET: raised vs embedded Si0.75Ge0.25 S/D benchmarking and in-depth hole transport study

A Dy2O3-capped HfO2 dielectric and TaCx-based metals enabling low-Vt single-metal-single-dielectric gate stack

A novel methodology for sensing the breakdown location and its application to the reliability study of ultra-thin Hf-silicate gate dielectrics

A reliable metric for mobility extraction of short channel MOSFETs

A study of relaxation current in high-k gate stacks

Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF

Accurate reliability evaluation of non-uniform ultrathin and high-k layers

Achievements and challenges for the electrical performance of MOSFETs with high-k gate dielectrics

Addressing key concerns for implementation of Ni FUSI into manufacturing for 45/32 nm CMOS

Advanced electrical characterization toward (sub) 1nm EOT HfSiON – hole trapping in PFET and L-dependent effects

Advanced high-k materials and electrical analysis for memories: the role of SiO2-high-k dielectric intermixing

ALD deposition of high-k and metal gate stacks for advanced CMOS applications

An assessment of the mobility degradation induced by remote charge scattering

Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements

Anomalous positive-bias temperature instability of high-k/metal gate devices with Dy2O3 capping

Anomalous positive-bias temperature instability of high-k/metal gate nMOSFET devices with Dy2O3 capping

Atomic and electrical characterisation of amorphous silicon passivation layers

Bipolar switching characteristics and scalability in NiO layers made by thermal oxidation of Ni

Characterization of charge trapping in SiO2/HfO2 dielectrics