Browsing by author "Bellens, Rudi"
Now showing items 1-19 of 19
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A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides
Degraeve, Robin; Groeseneken, Guido; Bellens, Rudi; Depas, Michel; Maes, Herman (1995) -
A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs
Habas, Predrag; Bellens, Rudi; Groeseneken, Guido (1995) -
A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1998) -
Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.; Deferm, Ludo (1995) -
Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology
Habas, Predrag; Bellens, Rudi; Groeseneken, Guido; Van den bosch, G.; Deferm, Ludo (1995) -
Charge pumping of single interface traps in submicron MOSFET's
Groeseneken, Guido; De Wolf, Ingrid; Bellens, Rudi; Maes, Herman (1994) -
Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1996) -
FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
Mieville, Jean-Paul; Van den Bosch, Geert; Deferm, Ludo; Bellens, Rudi; Groeseneken, Guido; Maes, Herman; Schoenmaker, Wim (1994) -
Hot-carrier degradation behavior of N- and P-channel MOSFETs under dynamic operation conditions
Bellens, Rudi; Groeseneken, Guido; Heremans, Paul; Maes, Herman (1994) -
Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions
Groeseneken, Guido; Bellens, Rudi; Van den Bosch, Geert; Maes, Herman (1995) -
New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides
Groeseneken, Guido; Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Depas, Michel; Maes, Herman (1996) -
New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
Degraeve, Robin; Groeseneken, Guido; Bellens, Rudi; Ogier, Jean-Luc; Depas, Michel; Roussel, Philippe; Maes, Herman (1998) -
Observation of single interface traps in submicron MOSFET's by charge pumping
Groeseneken, Guido; De Wolf, Ingrid; Bellens, Rudi; Maes, Herman (1996) -
On the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
On the hot-carrier-induced post-stress interface trap generation in n-channel MOS transistors
Bellens, Rudi; De Schrijver, Erik; Van den Bosch, Geert; Groeseneken, Guido; Heremans, Paul; Maes, Herman (1994) -
Performance and reliability aspects of FOND: A new deep submicron CMOS device concept
Bellens, Rudi; Van den Bosch, Geert; Habas, Predrag; Mieville, Jean-Paul; Badenes, Gonçal; Clerix, Andre; Groeseneken, Guido; Deferm, Ludo; Maes, Herman (1996) -
Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G. (1995) -
Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions
Groeseneken, Guido; Bellens, Rudi; Van den Bosch, Geert; Maes, Herman (1994)