Browsing by author "Ferain, Isabelle"
Now showing items 1-20 of 34
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Advanced electrical characterization toward (sub) 1nm EOT HfSiON – hole trapping in PFET and L-dependent effects
Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; Aoulaiche, Marc; Trojman, Lionel; Ferain, Isabelle; San Andres Serrano, Enrique; Groeseneken, Guido; Zhang, J.F.; Heyns, Marc; Jurczak, Gosia; De Gendt, Stefan (2007) -
Capping-metal gate integration technology for multiple-VT CMOS in MuGFETs
Veloso, Anabela; Witters, Liesbeth; Demand, Marc; Ferain, Isabelle; Son, Nak Jin; Kaczer, Ben; Roussel, Philippe; Adelmann, Christoph; Brus, Stephan; Richard, Olivier; Bender, Hugo; Conard, Thierry; Vos, Rita; Rooyackers, Rita; Van Elshocht, Sven; Collaert, Nadine; De Meyer, Kristin; Biesemans, Serge; Jurczak, Malgorzata (2008) -
Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection
Toledano-Luque, M.; Pantisano, Luigi; Degraeve, Robin; Zahid, Mohammed; Ferain, Isabelle; San Andres Serrano, Enrique; Groeseneken, Guido; De Gendt, Stefan (2007) -
Dominant layer for stress-induced positive charges in Hf-based gate stacks
Zhang, Jian F.; Chang, M.H.; Ji, Z.; Lin, L.; Ferain, Isabelle; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
Fabrication and characterization of SOI multi gate field effect transistors with high-k dielectrics and metal gates
Ferain, Isabelle (2008-12) -
Flexible and robust capping-metal gate integration technology enabling multiple-VT CMOS in MuGFETs
Veloso, Anabela; Witters, Liesbeth; Demand, Marc; Ferain, Isabelle; Son, Nak-Jim; Kaczer, Ben; Roussel, Philippe; Simoen, Eddy; Kauerauf, Thomas; Adelmann, Christoph; Brus, Stephan; Richard, Olivier; Bender, Hugo; Conard, Thierry; Vos, Rita; Rooyackers, Rita; Van Elshocht, Sven; Collaert, Nadine; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008) -
Fundamentals and extraction of velocity saturation in sub-100nm (110)-Si and (100)-Ge
Pantisano, Luigi; Trojman, Lionel; Mitard, Jerome; De Jaeger, Brice; Severi, Simone; Eneman, Geert; Crupi, G.; Hoffmann, Thomas Y.; Ferain, Isabelle; Meuris, Marc; Heyns, Marc (2008) -
GIDL (gate-induced drain leakage) and parasitic Schottky barrier leakage elimination in aggressively scaled HfO2/TiN FiNFET devices
Hoffmann, Thomas Y.; Doornbos, Gerben; Ferain, Isabelle; Collaert, Nadine; Zimmerman, Paul; Goodwin, Michael; Rooyackers, Rita; Kottantharayil, Anil; Yim, Yong Sik; Dixit, Abhisek; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2005) -
Impact of galvanic corrosion on metal gate stacks
Wada, Masayuki; Garaud, Sylvain; Ferain, Isabelle; Collaert, Nadine; Sano, Ken-Ichi; Snow, Jim; Vos, Rita; Leunissen, Peter; Mertens, Paul; Eitoku, A (2008) -
Integration challenges for multi-gate devices
Collaert, Nadine; Brus, Stephan; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Goodwin, Michael; Kottantharayil, Anil; Rooyackers, Rita; Verheyen, Peter; Yim, Yong Sik; Zimmerman, Paul; Beckx, Stephan; Degroote, Bart; Demand, Marc; Kim, Myeong-Cheol; Kunnen, Eddy; Locorotondo, Sabrina; Mannaert, Geert; Neuilly, Francois; Shamiryan, Denis; Baerts, Christina; Ercken, Monique; Laidler, David; Leys, Frederik; Loo, Roger; Lisoni, Judit; Snow, Jim; Vos, Rita; Boullart, Werner; Pollentier, Ivan; De Gendt, Stefan; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2005) -
Interface formation in rare-earth oxide containing advanced gate stacks
Adelmann, Christoph; Ferain, Isabelle; Franquet, Alexis; Conard, Thierry; Witters, Thomas; Richard, Olivier; Bender, Hugo; Meersschaut, Johan; Kittl, Jorge; Van Elshocht, Sven (2008) -
Interface stability in advanced high-k-metal-gate stacks
Adelmann, Christoph; Franquet, Alexis; Conard, Thierry; Witters, Thomas; Ferain, Isabelle; Meersschaut, Johan; Jurczak, Gosia; De Meyer, Kristin; Kittl, Jorge; Van Elshocht, Sven (2009) -
Line width dependent mobility in high-k – a comparative performance study between FUSI and TiN
Pantisano, Luigi; Trojman, Lionel; Severi, Simone; San Andres Serrano, Enrique; Kerner, Christoph; Veloso, Anabela; Ferain, Isabelle; Hoffmann, Thomas Y.; Groeseneken, Guido; De Gendt, Stefan (2007) -
Low-voltage 6T FinFET SRAM cell with high SNM using HfSiON/TiN gate stack, fin widths down to 10nm and 30nm gate length
Collaert, Nadine; von Arnim, Klaus; Rooyackers, Rita; Vandeweyer, Tom; Mercha, Abdelkarim; Parvais, Bertrand; Witters, Liesbeth; Nackaerts, Axel; Altamirano Sanchez, Efrain; Demand, Marc; Hikavyy, Andriy; Demuynck, Steven; Devriendt, Katia; Bauer, F.; Ferain, Isabelle; Veloso, Anabela; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008) -
Low-voltage scaled 6T FinFET SRAM cells
Collaert, Nadine; von Arnim, Klaus; Rooyackers, Rita; Vandeweyer, Tom; Mercha, Abdelkarim; Parvais, Bertrand; Witters, Liesbeth; Nackaerts, Axel; Altamirano Sanchez, Efrain; Demand, Marc; Hikavyy, Andriy; Demuynck, Steven; Devriendt, Katia; Bauer, F.; Ferain, Isabelle; Veloso, Anabela; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2010-08) -
Metal gate technology using a Dy2O3 dielectric cap approach for multiple-VT in NMOS FinFETs
Ferain, Isabelle; Son, Nak Jin; Witters, Liesbeth; Collaert, Nadine; Onsia, Bart; Kaczer, Ben; Kauerauf, Thomas; Adelmann, Christoph; Richard, Olivier; Favia, Paola; Bender, Hugo; Vos, Rita; Van Elshocht, Sven; Lehnen, Peer; San Tamer, Kemal; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2007) -
Metal gate thickness optimization for MuGFET performance improvement
Ferain, Isabelle; Collaert, Nadine; O'Sullivan, Barry; Conard, Thierry; Popovici, Mihaela Ioana; Van Elshocht, Sven; Swerts, Johan; Jurczak, Gosia; De Meyer, Kristin (2008) -
Methodology for flatband voltage measurement in fully depleted floating-body FinFETs
Ferain, Isabelle; Pantisano, Luigi; O'Sullivan, Barry; Singanamalla, Raghunath; Collaert, Nadine; Jurczak, Gosia; De Meyer, Kristin (2008) -
Minimization of the MuGFET contact resistance by integration of NiSi contacts on epitaxially raised source/drain regions
Dixit, Abhisek; Rooyackers, Rita; Leys, Frederik; Kaiser, Monja; Weemaes, R.; Ferain, Isabelle; De Keersgieter, An; Collaert, Nadine; Surdeanu, Radu; Goodwin, Michael; Zimmerman, Paul; Loo, Roger; Caymax, Matty; Jurczak, Gosia; Biesemans, Serge; De Meyer, Kristin (2005) -
Mobility and dielectric quality of 1-nm EOT HfSiON on Si(110) and (100)
Trojman, Lionel; Pantisano, Luigi; Ferain, Isabelle; Severi, Simone; Maes, Herman; Groeseneken, Guido (2008)