Browsing by Author "Aymerich, Xavier"

A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics

A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks

Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach

Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors

Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures

Gate voltage influence on the channel hot-carrier degradation of high-k-based devices

Improved characterization of high-k degradation with vacuum C-AFM

Influence of vacuum environment in conductive AFM measurements on advanced MOS gate dielectrics

Influence of vacuum environment on conductive atomic force microscopy measurements of advanced metal-oxide-semiconductor gate dielectrics

Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors

Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors

Nanoscale effects of annealing on the electrical characteristic of hafnium based devices measured in a vacuum environment

Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions

New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices

Processing dependences of CHC degradation on strained-Si pMOSFETs

Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric