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Scaled transistors with 2D materials from the 300mm fab
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Authors
Asselberghs, Inge
;
Schram, Tom
;
Smets, Quentin
;
Groven, Benjamin
;
Brems, Steven
;
Phommahaxay, Alain
;
Cott, Daire
;
Dupuy, Emmanuel
;
Radisic, Dunja
;
de Marneffe, Jean-Francois
;
Thiam, Arame
;
Li, Waikin
;
Devriendt, Katia
;
Gaur, Abhinav
;
Verreck, Devin
;
Maurice, Thibaut
;
Lin, Dennis
;
Morin, Pierre
;
Radu, Iuliana
EISBN
978-1-7281-9735-7
ISSN
2161-4636
Conference
IEEE Silicon Nanoelectronics Workshop (SNW)
Journal
na
Title
Scaled transistors with 2D materials from the 300mm fab
Publication type
Proceedings paper
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Conference contributions
Version history
Version
Item
Date
Summary
3
20.500.12860/38203.3
*
2022-01-27T10:32:27Z
validation by library/open access desk
1
20.500.12860/38203
2021-11-02T16:05:16Z
*Selected version
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