Browsing by Author "Schrimpf, Ronald D."

3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs

Comparison of charge pumping and 1/f noise in irradiated Ge pMOSFETs

Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide

Effects of halo doping and Si capping layer thickness on total-dose effects in Ge p-MOSFETs

Effects of processing and radiation bias on leakage currents in Ge pMOSFETs

Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions

Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs

Random Telegraph Noise and Radiation Response of 80 nm Vertical Charge-Trapping NAND Flash Memory Devices With SiON Tunneling Oxide

Single-Event Transient Response of Vertical and Lateral Waveguide-Integrated Germanium Photodiodes

Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO2 Oxygen-Penetration Layers

Total-ionizing-dose effects in InGaAs MOSFETs with high-k gate dielectrics and InP substrates

Total-ionizing-dose effects on InGaAs FinFETs with improved gate stack

Total-ionizing-dose effects on InGaAs FinFETs with modified gate stack