Browsing by author "Aymerich, Xavier"
Now showing items 1-20 of 21
-
A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
Amat, Esteve; Kauerauf, Thomas; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Degraeve, Robin; Groeseneken, Guido (2013) -
A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs
Wu, Qian; Bayerl, A.; Porti, Marc; Martin-Martinez, Javier; Lanza, Mario; Rodiguez, Rosanna; Velayudhan, Vikas; Nafria, Montserrat; Aymerich, Xavier; Gonzalez, Mireia B; Simoen, Eddy (2014) -
Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2010) -
Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2009) -
Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; De Keersgieter, An; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2009) -
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Amat, Esteve; Rodriguez, Rosana; Bargallo Gonzalez, Mireia; Martin Martinez, Javier; Nafria, Montse; Aymerich, Xavier; Machkaoutsan, Vladimir; Bauer, M.; Verheyen, (2010) -
Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach
Wu, Qian; Porti, Marc; Bayerl, Albin; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Simoen, Eddy (2015) -
Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2009) -
Gate voltage influence on the channel hot-carrier degradation of high-k-based devices
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Groeseneken, Guido (2011) -
Improved characterization of high-k degradation with vacuum C-AFM
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Influence of vacuum environment in conductive AFM measurements on advanced MOS gate dielectrics
Aguilera, Lidia; Polspoel, Wouter; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2007) -
Influence of vacuum environment on conductive atomic force microscopy measurements of advanced metal-oxide-semiconductor gate dielectrics
Aguilera, Lidia; Polspoel, Wouter; Volodin, Alexander; Van Haesendonck, Chris; Porti, Marc; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2008) -
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors
Bayerl, Albin; Lanza, Mario; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier; De Gendt, Stefan (2013) -
Nanoscale effects of annealing on the electrical characteristic of hafnium based devices measured in a vacuum environment
Aguilera, Lidia; Polspoel, Wouter; Porti, Marc; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2008) -
Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions
Moras, Miquel; Martin-Martinez, Javier; Rodriguez, Rosanna; Nafria, Montse; Aymerich, Xavier; Simoen, Eddy (2013) -
New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices
Amat, Esteve; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Kauerauf, Thomas; Degraeve, Robin; Groeseneken, Guido (2009) -
Processing dependences of CHC degradation on strained-Si pMOSFETs
Amat, Esteve; Martin Martinez, Javier; Bargallo Gonzalez, Mireia; Rodriguez, Rosana; Nafria, Montse; Simoen, Eddy; Verheyen, Peter; Aymerich, Xavier (2010) -
Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2010)