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Demonstration of an InGaAs gate stack with sufficient PBTI reliability by thermal budget optimization, nitridation, high-k material choice, and interface dipole
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117 since deposited on 2021-10-23
38last month
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Acq. date: 2025-12-11
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1930 since deposited on 2021-10-23
Acq. date: 2025-12-11
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117 since deposited on 2021-10-23
38last month
8last week
Acq. date: 2025-12-11
Views
1930 since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations