Browsing by Author "Meneghesso, G."

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

A statistical approach to microdose induced degradation in FinFET devices

Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

Dynamic-ron control via proton irradiation in AlGaN/GaN transistors

Electrostatic discharge effects in fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques

ESD sensitivity of 65-nm fully depleted SOI MOSFETs with different strain-inducing techniques

ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping

High-Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps

Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors

Impact of radiation on the operation and reliability of deep submicron CMOS technologies

Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors

Impact of strain on ESD robustness of FinFET devices

Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs

IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors

Microdose and breakdown effects induced by heavy ions on sub 20-nm triple gate SOI FETs

On the origin of the leakage current in p-gate AlGaN/GaN HEMTs

Study and characterization of GaN MOS capacitors: Planar vs trench topographies

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications